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Learn to Make Power Amplifier Tests Faster!

1   Hour | Webcast - recorded | Where & When


The continued proliferation of wireless mobile devices has created pressure to simultaneously reduce cost and increase data throughput without sacrificing battery life. These two requirements create conflicting challenges for test engineers because they must attempt to reduce overall test system cost and test times despite the added test system cost and complexity inherent to techniques such as digital predistortion (DPD) and envelope tracking.

This paper will address the key issues in a power amplifier test systems including:
• Key test challenges
• Test system techniques to optimize throughput
• New emerging technologies such as envelope tracking and DPD and their implications


• Wireless device: Test engineers, design engineers, manufacturing engineers, test engineering managers, design engineering managers
• Power Amplifier: Designers, Test engineers, test engineering managers, manufacturing engineers, manufacturing engineering managers


Joan Gibson, Product/Solutions Marketing Engineer, Agilent Technologies

Joan Gibson joined HP/Agilent in 1987. Joan has over 19 years of experience in RF and Microwave applications across a range of different test and measurement products, with over 12 years of experience as a Product /Solutions Marketing Engineer.

Currently Joan works as a solution marketing engineer based in Santa Rosa, California focusing on Microwave and RF signal analyzers in modular form factors such as PXI and AXIe.

Joan holds a Bachelor of Science in Electrical Engineering degree from Santa Clara University, Santa Clara, California.

Where & When

Price Location For more information
Free At Your PC Enroll to view the March 6, 2014 recorded broadcast 

Prices shown are list prices and are subject to change without notice.

Training & Event Materials

Learn to Make Power Amplifier Tests Faster Webcast Slides 
Slides from the March 6 2014 webcast

Seminar Materials 2014-03-06