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Overcome Critical Power Consumption Testing Challenges Webcast

1   小时 | 网上直播 -- 已存档的 | 地点和时间

Learn to drastically improve the accuracy and dependability of test results in your design cycle from start to finish. Missing a very small design flaw related to analyzing power consumption can quickly escalate into bigger issues along the development cycle.

Join Steven Lee, application engineer, as he teaches you how: low current measurement, output sequencing and data logging can help you avoid issues like:

• Extra prototype builds
• Defective end products
• Costly product recalls

This webcast will not only save you money, but most importantly, it will result in satisfied end-customers. 

PRESENTER

Steven Lee, Application Engineer, Keysight Technologies

Steven Lee is an application engineer at Keysight Technologies. For the past 10 years, Steven has specialized in the area of power related applications working with customers who use Keysight power products. His experience at Keysight includes various roles in marketing including product support and international business development. Steven holds a degree in Electrical and Computer Engineering from Cornell University.

地点和时间

价格 地点 更多信息
免费 At Your PC Enroll to view the December 13, 2017 recorded broadcast 

显示价格为标准定价,如有变更,恕不另行通知。