Here’s the page we think you wanted. See search results instead:


Contact an Expert

Millimeter-wave Measurement Insights

 See more at HOTSPOTS Homepage

Millimeter-wave Measurement Insights - Full Day Agenda
Register - At the bottom of the page
Welcome & Overview – Keysight
Millimeter-wave Signal Generation
Networking and Refreshment Break
Millimeter-wave Signal Analysis
Lunch Break
Millimeter-wave Device Characterization
Networking & Refreshment Break
Hands-on and demonstrations

Papers & Abstracts

Welcome and Overview: The drivers beyond the millimeter wave frequency race

Next generation wireless systems such as 5G cellular communications, front-haul and back-haul networks, military and automotive radar, and IEEE 802.11ad and 802.11ay WiGig are targeting a range of new capabilities including higher bandwidth, more connected devices, low latency, and better coverage. To address the wide bandwidth requirements, researchers are exploring the higher frequencies in the centimeter and millimeter wave bands where more spectrum is readily available. Compared to the traditional bandwidths used at sub-6 GHz for cellular communications, the use of hundreds or even several gigahertz of spectrum at these higher frequencies require new components with much higher physical tolerances to achieve the desired performance. The measurement techniques used to measure the RF performance of these new devices also require special consideration. This seminar will cover the basics of cm & mmWave technologies from the perspective of spectrum, wavelength, and bandwidth. A number of associated design and measurement challenges will be examined along with examples of how to solve them.

Millimeter-wave Signal Generation

“The quest for lowest wideband EVM”

New considerations for signal generation need to be made when working in millimeter wave bands. Errors like phase noise, IQ, and frequency response errors can be worse at millimeter wave and need to be addressed in order to ensure that researchers can make full use of this wideband technology. The possibility to generate a very high quality signal with a low error vector magnitude (EVM) and with low spurious content is fundamental to guarantee that the system under test performs as expected. In this presentation, we will discuss the challenges in generating a mm-wave signal and considerations to be made when choosing a test solution to meet your design and test needs.

Millimeter-wave Signal Analysis

“Tackling the Multi-GHz Bandwidth Challenge”

The rapidly increasing frequency ranges and bandwidths of today’s 5G and emerging communication research creates new challenges in millimeter-wave design validation. Millimeter-wave frequencies expose assumptions of what is, and is not, negligible and steal raw performance including power, losses, noise and dynamic range. As measurement uncertainties become dramatically wider, making reliable measurements becomes significantly more difficult.
In this presentation, we will cover the latest cm-Wave and mm-Wave test challenges with a series of case studies at 28 GHz, 73 GHz, and up to 110 GHz. We will also explore a variety of “testbed” configurations that can be easily adapted by combining software with flexible, high-performance, time & frequency-domain measurement equipment designed to support applications including 5G, emerging 802.11ad/ay, and back-haul applications with bandwidths up to 5 GHz wide. An ultra-wideband signal analyzer capable of 110 GHz in a single sweep is introduced to hunt for spectral emissions and spurs that typical banded-frequency systems can miss, enabling earlier troubleshooting of risky architectural issues in R&D.

Millimeter-wave Device Characterization

“Achieve Metrology-Grade results”

With the increased demand for the transfer of large volumes of data at high speeds, there is an increasing need to utilize the millimeter wave frequency band. This places an increased demand on designers and manufacturers in the industry to fully characterize and test both active and passive components at the millimeter wave frequencies. This presentation will focus on how a Vector Network Analyzer can be utilized to address the need for millimeter wave component characterization for both passive and active devices. 


Register for one of the events by clicking on the appropriate link in the table below.

Alternatively, receive notifications of future Millimeter-wave Measurement Insights HOTSPOTS Seminars as they become available by clicking ‘Notify me’.


Where & When

Date(s) Location Seminar's Language For more information
2018-09-11 Leuven, Belgium English Register Here
2018-09-13 Eindhoven, Netherlands English Register Here
2018-10-24 Barcelona, Spain Spanish Register Here
2018-10-25 Vigo, Spain Spanish Register Here
2018-11-14 Edinburgh, UK English Register Here