Choose a country or area to see content specific to your location
-
PRODUCTS AND SERVICES
- Oscilloscopes
-
Analyzers
- Spectrum Analyzers (Signal Analyzers)
- Network Analyzers
- Logic Analyzers
- Protocol Analyzers and Exercisers
- Bit Error Ratio Testers
- Noise Figure Analyzers and Noise Sources
- High-Speed Digitizers and Multichannel DAQ Solutions
- AC Power Analyzers
- DC Power Analyzers
- Materials Test Equipment
- Device Current Waveform Analyzers
- Parameter / Device Analyzers and Curve Tracers
- Meters
- Generators, Sources, and Power Supplies
- Software
- Wireless
- Modular Instruments
- Network Test and Security
- Network Visibility
- Services
- Additional Products
- All Products, Software, Services
- Learn
- Buy
- Support
- Home
- Resources
- Resources
What are you looking for?
Convolution Simulator
The Convolution Simulator is an advanced time-domain simulator that extends the capability of the High-Frequency SPICE Simulator by accurately simulating frequency-dependent components (distributed elements, S-parameter data files, transmission lines, etc.) in a time-domain simulator.
Designers can use Convolution to efficiently and accurately analyze transient circuit conditions while considering the full effects of all circuit components.
Product Highlights
- Transient Noise Simulation with a wider range of supported devices including all linear and nonlinear device models
- Speed - The Transient simulator continues to improve in simulation speed
- Effectively models off-chip elements and simulates chip to board interactions
- Extends the capability by including arbitrary frequency domain data files such as S-parameters
- Swept variable analysis for determining optimum solutions
- Time-to-frequency-domain transform enables RF designers to view results in the frequency domain
- Platform Computing Load Sharing Facility (LSF) supports the following options:
- Find the fastest available server and run
- Run simultaneous simulations
- Distributed Processing. Most efficient for sweeps that don't require the solution of the previous run
- Variable Equations (VAREQN) variables can be referenced in Measurement equations (MEASEQN) and Optimization/Yield/DOE (Design of Experiments) controllers
- Measurement equations can access the contents of any existing dataset. This can be very useful in optimization and yield analysis where goals/specs can make direct reference to existing data. The data may be generated from a previous simulation, or from an external source such as another simulator, or an instrument
- Advanced statistical design capability aids in optimizing performance and production yield. Capabilities include automatic normalization of sensitivity analysis output and optional run of final analysis after optimization run completion
Unlike High-Frequency SPICE, the Convolution Simulator can also simulate circuits that contain components characterized with measured S-parameter data. The Convolution Simulator evaluates high-frequency effects such as skin effect, dispersion, and higher frequency loss. Typical examples include analyzing transient conditions where the effects of dispersion and discontinuities are significant, and observing the effects of off-chip elements, and chip-to-board interactions in IC simulations.
A time-to-frequency-domain transform is included. This feature enables RF designers to view results in the frequency domain when desired. The Convolution Simulator can also produce transient, nonlinear analyses with respect to optional swept variables. Voltage, current and user defined measurements can be manipulated mathematically using built in post processing.
The Convolution Simulator is integrated into the ADS Transient Convolution Element.
- © Keysight Technologies 2000–2024
- Privacy
- Sitemap
- Terms
- Trademark Acknowledgements
- Feedback
- Accessibility