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Test Methods and Specifications for Keysight Medalist i3070 Series 5

The Keysight Medalist i3070 Series 5 In-Circuit Test (ICT) system enables incorporation of external plug-in circuits. It also enables a wider range of power handling capabilities for today's high-powered products, including real time monitoring of your board power nodes. The system allows manufacturers to enjoy significantly higher throughput, thereby increasing production volumes and at the same time, making more tester resources available.

Please refer to the Medalist i3070 Series 5 test methods and specifications for details.

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