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On-Wafer Test of Power Devices

Reduce your Development Time for Power Devices with On-Wafer Test

The combination of the Keysight B1505A and Cascade Microtech’s Tesla system provides the capabilities you need in a system designed specifically for power devices. With the Tesla system you can migrate your characterization from in-package to on-wafer test, optimize your development process and, as a result, reduce the product development time for your power devices.

  • On-wafer test of power devices
  • Reduce the development time for power devices
  • Supports probing at up to 3,000 V, 100 A and 100 W/cm2
  • Light curtain and interlocks for operator safety
  • Advanced chuck mechanism for low contact resistance and low noise
  • Uses Keysight B1505A power device analyzer/curve tracer
  • Request more information and Keysight’s partner, Cascade Microtech, will contact you to discuss your requirements in more detail.

Documents & Downloads

On-Wafer Test of Power Devices 
Co-branded Solutions Partner brochure with Cascade Microtech - Modular, Reduce your Development Time for Power Devices with On-Wafer Testing

Brochure 2012-01-11

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