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World Leading High-Accurate Dk/Df Measurement System, PCB Measurement, 900MHz - 15GHz

Highly accurate in dielectric loss tangent (tanδ) measurement and requires no conductor pattern; Optimum solution for thin film measurement

《ASTM, IPC Standard compliant》
DPS50 is a resonance method, strip line type dielectric constant and dielectric loss tangent measurement system optimized for sheet materials with dielectric constant of approximately 1 to 20 and relatively small dielectric loss in the frequency range of 900MHz to 15GHz. This system is compliant with the IPC-TM-650 2. 5. 5. 5. 1
Stripline Test for Complex Relative Permittivity of Circuit Board Materials to 14GHz, and ASTMD3380 Standard Method of Test for Permittivity (Dielectric Constant) and Dissipation Factor of Plastic-Based Microwave Circuit Substrates. This measurement technique was announced at 2008 IEEEI2MTC.

Compliance standards
IPC-TM-650, ASTM 3380

Publications
Suzuki, H. ; Hotchi, T. ; Nojima, T.
"A New Measurement System for the Perpendicular Complex Permittivity to DUT Sheet by Stripline Simulation"
Instrumentation and Measurement, IEEE Transactions on (Volume:61, Issue: 9 )
pp2476 - 2482 Date of Publication: Sept. 2012

Specimen examples

  • PCB (Prepreg)
  • Planar antenna
  • Film

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World Leading High-Accurate Dk/Df Measurement System, PCB Measurement, 900MHz - 15GHz 
Highly accurate in dielectric loss tangent (tanδ) measurement and requires no conductor pattern; Optimum solution for thin film measurement

型錄 2019-04-24

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