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18-140GHz Sheet, Ultra-thin Sheet Permittivity and Dielectric Loss Tangent Measurement System

KEYCOMSupports specimens as thin as 5μm in wide frequency range of 18GHz~140GHz


《JIS Standard》
KEYCOM’s Fabry-Perot εr and tanδ measurement system of open resonator method, which attains measurement accuracy as 0.0001 level of tanδ. Because of high accuracy, it is possible to measure ultra-thin sheet and specimens of low tanδ materials such as PTFE. This measurement system is popular among many manufacturers not only for the purpose of reliable reports for submission as it is JIS standardized, but also for the purpose of R&D as it can check very slight difference of characteristics.

Standardization
JIS R 1660-2
(Japanese Industrial Standards)

Publications

H.Suzuki, T.Kamijo
“Millimeter wave measurement of complex permittivity by perturbation method using open resonator”
IEEE Trans. Instrumentation and Measurement
VOL.57. No.12, Dec.2008
pp2868-2873

Specimen examples

  • Printed Circuit board
  • Thin film
  • Radome
  • Ceramics
  • PTEFE film
  • PE film
  • Sapphire plate
  • Alumina plate

        etc.

Related link

PNA Network Analyzers, 300 kHz to 1.1 THz

ENA Series Network Analyzers, 5 Hz to 20 GHz

Network Analyzers

文件及下載

18-140GHz Sheet, Ultra-thin Sheet Permittivity and Dielectric Loss Tangent Measurement System 
Supports specimens as thin as 5μm in wide frequency range of 18GHz~140GHz

型錄 2018-01-22

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