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On-Wafer Test of Power Devices

Reduce your Development Time for Power Devices with On-Wafer Test

The combination of the Keysight B1505A and FormFactor’s Tesla system provides the capabilities you need in a system designed specifically for power devices. With the Tesla system you can migrate your characterization from in-package to on-wafer test, optimize your development process and, as a result, reduce the product development time for your power devices.

  • On-wafer test of power devices
  • Reduce the development time for power devices
  • Supports probing at up to 3,000 V, 100 A and 100 W/cm2
  • Light curtain and interlocks for operator safety
  • Advanced chuck mechanism for low contact resistance and low noise
  • Uses Keysight B1505A power device analyzer/curve tracer
  • Request more information and Keysight’s partner, FormFactor, will contact you to discuss your requirements in more detail.

文件及下載

On-Wafer Test of Power Devices - Solution Brochure 
This is a co-branded brochure from Keysight Technologies and FormFactor that explains how you can reduce your development time for power devices with the On-Wafer Test Solution for Power Devices.

型錄 2018-06-14

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