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MTEK Series - Legacy ATE System Upgrade Kit

Easily extend the life of your legacy semiconductor ATE with this low-cost PXI-based, add-on solution

Marvin Test Solutions’ cost-effective, Marvin Test Expansion Kit (MTEK) Series platform breathes new life into legacy semiconductor test systems with a PXI-based, add-on solution that easily adds capability without the expense of replacing the entire test system.
When used with Keysight Technologies’ RF instrumentation, MTEK adds the capabilities required to address a wide range of RF and mixed-signal device testing requirements for both wafer and packaged test. The MTEK’s open architecture can accommodate the full range of Keysight’s RF PXI products, Marvin Test Solutions’ extensive line of digital test products, as well as additional baseband instrumentation
 

  • Upgrade for legacy semiconductor test systems including Teradyne, LTX/Credence, and Verigy platforms
  • Cost-effective PXI-based, add-on solution with an open architecture
  • Easily add RF, digital, and analog performance
  • Add the performance you need with Keysight’s wide selection of RF instruments
  • Fast implementation; the PXI chassis becomes an extension of the host CPU
  • Simplified integration with existing test programs via DLL calls to the new instruments
  • Easy integration with test floor data collection, data analysis, etc.
  • Reduce time spent on training; little or no additional training for production personnel
  • Multisite capability for both wafer sort and packaged test