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World Leading High-Accurate Dk/Df Measurement System for Thin Film, 20GHz - 140GHz

KEYCOMSupports specimens as thin as 5μm in wide frequency range of 20GHz~140GHz

《JIS Standard》
KEYCOM’s Fabry-Perot εr and tanδ measurement system of open resonator method, which attains measurement accuracy as 0.0001 level of tanδ. Because of high accuracy, it is possible to measure ultra-thin sheet and specimens of low tanδ materials such as PTFE.

This measurement system is popular among many manufacturers not only for the purpose of reliable reports for submission as it is JIS standardized, but also for the purpose of R&D as it can check very slight difference of characteristics.

Standardization
JIS R 1660-2 (Japanese Industrial Standards)
* Fully compatible with JIS R1660-2-2004 specification by using the software for sheet. And for ultra thin sheet, it is complied with“ Millimeter wave measurement of complex permittivity by perturbation method using open resonator”IEEE Trans. Instrument and Measurement VOL.57. No.12, Dec.2008 pp2868-2873 ".

Publications
H.Suzuki, T.Kamijo
“ Millimeter wave measurement of complex permittivity by perturbation method using open resonator”
IEEE Trans. Instrumentation and Measurement
VOL.57. No.12, Dec.2008
pp2868-2873

Specimen examples

  • Printed Circuit board
  • Thin film
  • Radome
  • Ceramics
  • PTEFE film
  • PE film
  • Sapphire plate
  • Alumina plate

        etc.

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Документы и файлы для загрузки

World Leading High-Accurate Dk/Df Measurement System for Thin Film, 20GHz - 140GHz 
Supports specimens as thin as 5μm in wide frequency range of 20GHz~140GHz

Брошюра 2019-04-23

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