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High Power On-Wafer Load Pull Measurements

Impedance match your High Power Gallium Nitride HFETs with On-Wafer Load Pull Measurements

The bsw OWLP-2 provides a fully integrated solution that allows you to make on-wafer, high-power load pull and intermodulation measurements. With the OWLP-2 you can achieve high efficiency in your amplifier designs by accurately impedance matching your high power GaN HFETs circuits.

  • On-wafer load pull measurements for accurate impedance matching
  • Characterizes high-power gallium nitride HFETs
  • Optimize the performance of high-power, high-efficiency amplifiers
  • Fully integrated solution based on Keysight PNA-X network analyzer
  • Combines PNA-X with Maury tuners and Cascade wafer prober
  • Test system integration optimizes DUT signal paths
  • Measurement & control software provides overall control
  • Load pull and intermodulation measurements with same setup
  • Request more information and Keysight’s partner, bsw TestSystems, will contact you to discuss your requirements in more detail.

Documents & Downloads

High-Power On-Wafer Load Pull Measurements 
Co-branded Solutions Partner brochure with bsw TestSystems on high-power on-wafer load pull measurements

Brochure 2011-12-16

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