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B1500A Application Test : Using the B1500A with a Nanoprober to Perform Failure Analysis

Library Installation:

Install this software update in the following instrument:

  • B1500A with EasyEXPERT

Import this application test definition into the EasyEXPERT Library.
The "Failure_analysis for SRAM" application test definition is imported in the "CMOS" library category.

Revision:

This application test definition runs on all versions of EasyEXPERT.

Documentation:

Refer to the application note in Documents and Downloads below.

文档和下载

Failure Analysis for SRAM 

编程实例 2007-03-16

null ZIP 48 KB
是德科技 用带纳米探针的 Keysight B1500A 进行失效分析 
是德科技 用带纳米探针的 Keysight B1500A 进行失效分析

应用说明 2017-11-27