Here’s the page we think you wanted. See search results instead:


Contact an Expert

What is a silicon nail test on Keysight Medalist i3070?

The silicon nail test refers to the use of boundary register cells to replace the needs for physical probes on nodes during in circuit testing of non boundary scan device. The boundary register cells act as drivers and receivers, as shown in the figure. The device between the boundary scan devices is a non boundary scan part.

          Testing non boundary scan device using silicon nail

For more information about ict systems, please visit ICT System - Medalist i3070.