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Industry Publications on X-Parameters

 Below you will find a number of key industry publications related to X-parameters*.

  1. D. E. Root, J. Horn, L. Betts, C. Gillease, J. Verspecht, “X-parameters: The new paradigm for measurement, modeling, and design of nonlinear RF and microwave components,” Microwave Engineering Europe, December 2008 pp 16-21.
  2. D. E. Root, “X-parameters: Commercial implementations of the latest technology enable mainstream applications” Microwave Journal, Sept. 2009,
  3. J. Verspecht and D. E. Root, “Poly-Harmonic Distortion Modeling,” in IEEE Microwave Theory and Techniques Microwave Magazine, June, 2006.
  4. D . E. Root, J. Verspecht, D. Sharrit, J. Wood, and A. Cognata, “Broad-Band, Poly-Harmonic Distortion (PHD) Behavioral Models from Fast Automated Simulations and Large-Signal Vectorial Network Measurements,” IEEE Transactions on Microwave Theory and Techniques Vol. 53. No. 11, November, 2005 pp. 3656-3664
  5. J. Verspecht, J. Horn, L. Betts, D. Gunyan, R. Pollard, C. Gillease, D. E. Root, “Extension of X-parameters to include long-term dynamic memory effects,” IEEE MTT-S International Microwave Symposium Digest, 2009. pp 741-744, June, 2009
  6. J. Verspecht, J. Horn, D. E. Root “A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals,” Proceedings of the 75th IEEE MTT-S ARFTG Conference, May, 2010
  7. J. Xu, J. Horn, M. Iwamoto, D. E. Root, “Large-signal FET Model with Multiple Time Scale Dynamics from Nonlinear Vector Network Analyzer Data,” IEEE MTT-S International Microwave Symposium Digest, May, 2010.
  8. J. Horn, S. Woodington, R. Saini, J. Benedikt, P. J. Tasker, and D. E. Root; “Harmonic Load-Tuning Predictions from X-parameters,” IEEE PA Symposium, San Diego, Sept. 2009
  9. D. Gunyan , J. Horn, J. Xu, and D. E. Root, “Nonlinear Validation of Arbitrary Load X-parameter and Measurement-Based Device Models,” IEEE MTT-S ARFTG Conference, Boston, MA, June 2009
  10. G. Simpson, J. Horn, D. Gunyan, and D. E. Root, “Load-Pull + NVNA = Enhanced X-Parameters for PA Designs with High Mismatch and Technology-Independent Large-Signal Device Models, ” IEEE ARFTG Conference, Portland, OR December 2008.
  11. J. Horn, J. Verspecht, D. Gunyan, L. Betts, D. E. Root, and J. Eriksson, “X-Parameter Measurement and Simulation of a GSM Handset Amplifier,” 2008 European Microwave Conference Digest, Amsterdam, October, 2008
  12. J. Verspecht, D. Gunyan, J. Horn, J. Xu, A. Cognata, and D.E. Root, “Multi-tone, Multi-Port, and Dynamic Memory Enhancements to PHD Nonlinear Behavioral Models from Large-Signal Measurements and Simulations,” 2007 IEEE MTT-S Int. Microwave Symposium Digest, Honolulu, HI, USA, June 2007.
  13. D. E. Root, J. Xu, J. Horn, M. Iwamoto, and G. Simpson, “Device Modeling with NVNAs and X-parameters,” 2010 IEEE MTT-S INMMiC Conference, Gοtenborg, Sweden, April 26, 2010
  14. J. Horn, G. Simpson, D. E. Root, “GaN Device Modeling with X-parameters,” Accepted for publication 2010 IEEE CSICS, Oct. 2010

Learn more about X-parameters.

* X-parameters is a trademark of Keysight Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information on the use of this trademark, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.