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Ultra-Low Power Device Design and Validation

Ultra-Low Power Device Design and Validation

The number of mobile, battery-powered devices being developed is exploding as the growth in smartphone, medical device, Internet of Things (IoT) and wearable device markets align. These markets are driving new techniques and standards for ultra-low power (ULP) computing and communication. ULP processors employ multiple layers of ‘sleep mode’, allowing parts of the processor to be ‘powered down’, minimizing power needed for operation (low µAs of current). In order to design efficient power (battery) use for your device, it is important to characterize the power or current drawn during all modes of operation.

Traditional technologies for current measurements return only a partial picture due to their limited dynamic range and errors. Engineers were unable to characterize dynamic power events (e.g.ULP processor coming out of sleep mode) with a limited dynamic range for measuring current.

The Keysight N6705B DC Power Analyzer configured as current drain analyzer with the N6781A Source/Measurement Unit (SMU) overcomes this traditional limitation. This solution uses a patented Seamless Current Range technology which provides accurate measurements from 3A down to 100's of nA (like 28 bits of resolution) in a single acquisition. Additionally, the integrated data-logger, with gap free sample rates up to 200kSa/s, can capture days of current drain measurements for comprehensive device validation and characterization.

Because of this innovation, today hundreds of engineers have new insight, enabling them to design more power efficient IoT devices, wearable units and smartphones, etc.

Enhance the Battery Life of your Mobile or Wireless Device - Brochure