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International Microwave Symposium (IMS) 2017 
June 4 - 9, 2017; Honolulu, Hawaii

트래이드쇼

 
키사이트 EEsof EDA 고객 교육 및 서비스 
키사이트 EDA 고객 교육 및 서비스에 대한 간략한 개요

교육 자료 2017-08-08

 
Test at Breakneck Speeds with System Power Supplies Webcast 
Original broadcast March 30, 2017

웹캐스트 - recorded

 
Fundamentals of IV Measurements Webcast 
Original broadcast February 8, 2017

웹캐스트 - recorded

 
Using WaferPro Express with B2200A Switch Matrix 
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

세미나 프리젠테이션 2016-12-21

PDF PDF 2.35 MB
Accuracy matters: Calibration Options for Lab Standards Webcast 
Original broadcast May 19, 2016

웹캐스트

 
Multiport and Multi-site Test Optimization Techniques Webcast 
Original broadcast June 3, 2015

웹캐스트 - recorded

 
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast 
Original broadcast September 4, 2014

웹캐스트 - recorded

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

웹캐스트 - recorded

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

웹캐스트 - recorded

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

웹캐스트 - recorded

 
MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

세미나 프리젠테이션 2013-10-22

PDF PDF 1.48 MB
Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

세미나 프리젠테이션 2013-10-22

 
Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

세미나 프리젠테이션 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

세미나 프리젠테이션 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training 
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

교육