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Aerospace & Defense

Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm's way. Success depends on a changing mix of people and technology. As technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today's mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

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1-25 of 351

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

Application Note 2018-12-01

Pulsed Carrier Phase Noise Measurements - Application Note 
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2018-03-09

N1913A and N1914A EPM Series Power Meters E-Series and 8480 Series Power Sensors – Data Sheet 
This documents describe in the details the product specification and features for N1913A and N1914A.

Data Sheet 2018-02-21

EPM and EPM-P Series Power Meters E-Series Power Sensors - Configuration Guide 
This configuration guide describes the standard configurations, options, and compatible accessories of EPM Series and EPM-P Series power meters.

Configuration Guide 2018-02-21

i3070 Series 5i Inline In-Circuit Test System – Data Sheet 
Keysight’s i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

Data Sheet 2018-02-08

Phase Noise Measurement Solutions - Selection Guide 
This selection guide will discuss and compare Keysight's most common phase noise measurement techniques -- direct spectrum, phase detector, two-channel cross correlation, including selection tips.

Selection Guide 2018-01-26

Testing and Troubleshooting Digital RF Communications Receiver Designs (AN 1314) 
This Application Note covers the fundamental measurement principles involved in testing and troubleshooting digital communications receivers, particularly those used in digital RF cellular systems. Measurement setups are provided for receiver performance tests and troubleshooting tips are given.

Application Note 2018-01-26

Understanding Phase Noise Needs and Choices in Signal Generation - Application Note 
Learn about phase noise signal generator fundamentals and ways to optimize phase noise for your application.

Application Note 2018-01-12

Techniques for Precise Measurement Calibrations in the Field - Application Note 
This application note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

Application Note 2017-12-18

Protect Against Power-Related DUT Damage During Test - Application Note 
This application note discusses choosing a power supply with extensive integrated protection features to avoid power-related damage.

Application Note 2017-12-04

Solutions for Wideband Radar and Satcom Measurements - Application Brief 
This application brief talks about using wide bandwidth oscilloscopes to directly measure and analyze X, Ku, and Ka-band Radar and Satcom transmitter outputs up to 62 GHz.

Application Note 2017-12-02

Make Custom OFDM Measurements with 89600 VSA Software Option BHF - Application Note  
Read about how to configure 89600 VSA software with Option BHF custom OFDM modulation analysis to analyze and troubleshoot new, custom, proprietary, generic, or non-standard OFDM signals.

Application Note 2017-12-01

M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

Technical Overview 2017-12-01

PNA-X Series Microwave Network Analyzers - Brochure 
Learn how the PNA-X network analyzer provides complete linear and nonlinear compontent characterization in a single instrument. Includes customer case studies, features, specs, and more.

Brochure 2017-12-01

PDF PDF 18.78 MB
x1149 Boundary Scan Solution for Blade Server Board - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-12-01

Noise Figure Selection Guide - Minimizing the Uncertainties - Selection Guide 
This selection guide, which includes a brief noise figure primer and our current product lineup, is designed to help you find the best solution for your application.

Selection Guide 2017-12-01

Real-Time Spectrum Analyzer, X-Series Signal Analyzers - Technical Overview 
Real-time spectrum analyzer capabilities are an upgrade option to the PXA/MXA signal analyzers. Adding real-time lets you see, capture and understand the most elusive signals.

Technical Overview 2017-12-01

PXI and AXIe Products and Solutions Catalog 
Catalog for PXI and AXIe Products and Solutions

Catalog 2017-12-01

PDF PDF 14.41 MB
Addressing the Challenges of High-Speed Digital I/O for Aerospace Defense – Application Note 
This application note will also discuss test challenges and commercial test solutions for fiber digital I/O technologies to help mitigate risk in upgrading to fiber-based technologies.

Application Note 2017-12-01

Technology Refresh Services for X-Series Signal Analyzers - Flyer 
2-page flyer that explains and links to X-Series signal analyzer Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting.

Promotional Materials 2017-12-01

Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Technical Overview 2017-12-01

Payload Test System - Technical Overview 
Keysight's Payload Test System Platform uses state of the art measurement capability to provide a base configuration for Uplink and Downlink testing between UHF and Q band.

Technical Overview 2017-12-01

FPGA Implementation of a LUT-Based Input Processing - Application Note 
This application note demonstrates the implementation of a signal transformation using a lookup table (LUT). It implements a piecewise first-order linear approximation of a nonlinear function.

Application Note 2017-12-01

Simulation and Verification of Pulse Doppler Radar Systems - Application Note 
Keysight SystemVue illustrates key algorithms in modern Pulsed Doppler radar system design, and also connects to Keysight sources and signal analyzers to verify hardware performance.

Application Note 2017-12-01

PDF PDF 10.43 MB
Multi-Channel Antenna Calibration Reference Solution - Solution Brochure 
This brochure describes the Keysight Multi-Channel Antenna Calibration, Reference Solution -provides narrow-band antenna calibration: scalable channel count, antenna receive channels downconversion ...

Brochure 2017-12-01


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