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Aerospace & Defense

Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm's way. Success depends on a changing mix of people and technology. As technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today's mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

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PXI and AXIe Products and Solutions Catalog 
Catalog for PXI and AXIe Products and Solutions

Catalog 2017-09-01

PDF PDF 10.82 MB
M9393A PXIe Performance Vector Signal Analyzer - Data Sheet 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Data Sheet 2017-04-29

FPGA Implementation of a LUT-Based Digital Pre-Distortion - Application Note 
This application note demonstrates the implementation of a signal transformation using a lookup table (LUT). This program transforms a sawtooth signal into a sinusoidal.

Application Note 2017-01-05

FPGA Implementation of a LUT-Based Input Processing - Application Note 
This application note demonstrates the implementation of a signal transformation using a lookup table (LUT). It implements a piecewise first-order linear approximation of a nonlinear function.

Application Note 2017-01-05

M9393A PXIe Performance Vector Signal Analyzer - Configuration Guide 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Configuration Guide 2016-05-18

PDF PDF 2.26 MB
M9393A PXIe Performance Vector Signal Analyzer - Flyer 
This document provides the features, benefits and performance characteristics for the M9393A PXIe performance vector signal analyzer.

Brochure 2015-10-22

PDF PDF 500 KB
One Size Does NOT Fit All - Application Note 
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

Application Note 2015-06-08

M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

Technical Overview 2015-02-10

PDF PDF 2.39 MB
Choosing the Test System Software Architecture - Application Note 
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

PXIe Data Streaming for RF Interference Analysis - X-COM 
PXIe Data Streaming Solution for RF Interference and Spectrum Analysis from X-COM and Keysight

Solution Brief 2014-05-14

 
Accelerate PXI VSA Measurements with X-Series Measurement Applications for Modular Instrument 
This brochure describes the modular X-Series measurement applications which increase the efficiency and capability of the PXI VSA for specific communications standards

Brochure 2014-03-06

PDF PDF 1.31 MB
M9018A PXIe Chassis 18-Slots, 3U, 8GB/s - Data Sheet 
This data sheet describes the capability and advantages of the M9018A PXIe Chassis.

Data Sheet 2014-02-11

M9361A PXI Downconverter - Flyer 
The Keysight M9361A is a one-slot 3U PXI downconverter that converts microwave signals from 2.75 GHz to 26.5 GHz into baseband frequency signals centered at an IF frequency of 500 MHz.

Brochure 2013-12-06

PDF PDF 591 KB
M9210A PXI-H 10-bit Digitizing Scope Flyer 
The M9210A is a one-slot 3U PXI-Hybrid high-speed Digitizing Scope featuring 2 channels with 1.4 GHz analog bandwidth and up to 4 GS/s real-time sampling rate.

Brochure 2013-11-30

PDF PDF 180 KB
Switching Solutions 
This paper discusses Keysight's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note 
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

 
Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note 
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Application Note 2005-03-29

PDF PDF 263 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

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