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Wireless Connectivity

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science. The continuing innovation across new and existing wireless technologies presents challenges in designing and testing of components, modules and devices that make our connected world possible. As the world’s leading electronic measurement company, Keysight continues to be at the forefront offering a full portfolio of test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest standards. As an active member of the wireless standards bodies that define the technologies, we have been at the forefront of providing standard-compliant wireless test and design tools across all the technologies from Bluetooth to 60 GHz 802.11ad. We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future. Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for IoT, 5G, Cellular, MIMO and WLAN Test.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

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Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-12-01

MTEK Series - Legacy ATE SystemTester Upgrade Kit  
MTEK Series - Legacy ATE System Upgrade -Keysight Technologies and Marvin Test Solutions. Easily extend the life of your legacy semiconductor ATE with this low-cost, PXI-based, add-on solution

Brochure 2017-09-16

PDF PDF 451 KB
Integrated RF Test Solution 
Co-branded Solutions Partner brochure with Marvin Test Solutions on Integrated RF Test Solution

Brochure 2017-04-25

PDF PDF 236 KB
Spectrum Analysis Basics - Application Note 
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-11-02

Correlating Microwave Measurements between Handheld and Benchtop Analyzers - Application Note 
This application note discusses the powerful capabilities of modern-day handheld analyzers and includes measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Application Note 2015-08-27

Precision Validation, Maintenance and Repair of Satellite Earth Stations FieldFox Handheld Analyzers 
This application note describes breakthrough technologies that have transformed the way systems can be tested in the field while providing higher performance, improved accuracy and capability.

Application Note 2015-08-24

Techniques for Precise Measurement Calibrations in the Field - Application Note 
This application note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

Application Note 2015-05-22

Techniques for Precise Cable and Antenna Measurements in the Field - Application Note 
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.

Application Note 2015-05-15

Download your complimentary RF & Microwave Test Accessories Catalog 
This comprehensive resource enables engineers to quickly and conveniently research the highest-quality RF and microwave test accessories in the industry.

Catalog 2015-04-28

 
Techniques for Precise Interference Measurements in the Field - Application Note 
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.

Application Note 2015-03-30

Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note 
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2014-12-05

PDF PDF 607 KB
Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers 
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

Application Note 2012-02-08

Solutions for Wireless Network Installation and Maintenance 
Learn about Keysight's wireless network installation and maintenance solutions that allow you to test and monitor more cell sites in less time.

Brochure 2010-05-03

PDF PDF 1.75 MB
Solutions for Active Device Test 
This application note, Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems, shows how test system designers can design simpler test systems with the lowest overall cost of ownership.

Application Note 2009-05-05

UWB Antenna Measurements with the 20 GHz E5071C ENA Network Analyzer 
This application note describes benefits of measuring UWB antennas with the E5071C 20 GHz option and introduces measurement tips for using the gating feature with the E5071C.

Application Note 2008-11-10

Improve the Circuit Evaluation Efficiency of Wireless LAN Chip Set Design (AN 1463-2) 
This application note introduces circuit and component characteristics for the WLAN chipset design process using the ENA Series network analyzers. The topics highlighted are balanced measurements, fixture characterizations, and impedance matching.

Application Note 2003-08-14

PDF PDF 133 KB