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阻抗及阻抗匹配

阻抗测量不仅在无源元器件领域具有举足轻重的作用,在材料、电源等领域也非常重要。很多物理参数,例如电容(C)、电感(L)和电阻(R)都是以阻抗为基础进行测量。此外,材料参数(电容率:ε,导磁率:μ)也可通过阻抗测量导出。是德具有全套的阻抗测试设备和测试附件,可帮助您完成测量。选择是德的阻抗测量产品,您不仅可获得精确、可靠的测试结果,还能获得更多益处。

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是德科技 使用扫描仪和 Keysight 4263B LCR 表 进行高效的多抽头变压器测量 
是德科技 使用扫描仪和 Keysight 4263B LCR 表 进行高效的多抽头变压器测量

应用说明 2017-11-28

是德科技 高效变压器/低频线圈测试 
是德科技 高效变压器/低频线圈测试

应用说明 2017-11-28

是德科技 AN 1305-4 高效的 电解电容器测试 
是德科技 AN 1305-4 高效的 电解电容器测试

应用说明 2017-11-27

是德科技 使用 LCR 表和阻抗分析仪测量介电常数和 导磁率的解决方案 
是德科技 使用 LCR 表和阻抗分析仪测量介电常数和 导磁率的解决方案

应用说明 2017-11-26

是德科技 LCR 表、阻抗分析仪和测试夹具 
是德科技 LCR 表、阻抗分析仪和测试夹具

选型指南 2017-11-25

是德科技使用 E5061B 低频-射频网络分析仪测量直流-直流转换器和 PDN 
是德科技使用 E5061B 低频-射频网络分析仪测量直流-直流转换器和 PDN

应用说明 2017-11-23

N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

产品资料 2017-10-04

PDF PDF 3.63 MB
Impedance Measurement Handbook - 6th Edition - Application Note 
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

应用说明 2016-11-02

阻抗测量附件 
本文介绍了可以与 LCR 表、电阻表、电容表、阻抗分析仪和综合分析仪结合使用的所有阻抗测试夹具。

选型指南 2016-04-13

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer 
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

应用说明 2015-10-05

Accelerate Your MEMS Device Development & Manufacturing Efficiency Using Impedance Test Instruments 
This brochure describes a general overview of Keysight’s capabilities in MEMS device testing and generates awareness of Keysight impedance MEMS test solution to customer.

手册 2015-08-25

PDF PDF 1.70 MB
IMS 2015 Demos from Keysight EEsof EDA 
YouTube video playlist containing International Microwave Symposium (IMS) 2015 demo videos from Keysight EEsof EDA MicroApps.

基本演示 2015-06-19

 
How to Match RF Impedance Effectively By Optimally Selecting SMT Devices 
This video demonstrates a very effective RF impedance matching methodology with SMT devices that helps RF engineers save time and cost. With this methodology, RF engineers can start to match the design with a list of good combinations of SMT devices which satisfies the target impedance and loss specifications instead of trying out unlimited possibilities at the workbench. This methodology should work very well with typical wireless or mobile product designs such as smart phones.

视频演示 2015-06-11

 
Mobile Phone Load Pull Measurements - Maury Microwave 
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Keysight

Solution Brief 2015-03-26

 
Recommendations for Port Setup When Using ADS Momentum and Modelithics Models 
This application note is intended to help Advanced Design System (ADS) users using Modelithics models, simulate RF & Microwave circuits. The focus is on finding the optimum port setup for EM simulation of circuit layouts that include surface-mount technology (SMT) devices.

应用说明 2015-02-05

PDF PDF 1.43 MB
How to Design RF and Microwave Impedance Matching Networks 
This video describes how to design RF and Microwave impedance matching networks.

视频演示 2015-01-14

 
Power of Impedance Analyzer - Application Note 
This application note describes the necessity of real-characteristics evaluation, and shows that the impedance analyzers only have capabilities to achieve real-characteristics.

应用说明 2015-01-07

On-Wafer High Power Load Pull Measurements – bsw TestSystems 
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Keysight

Solution Brief 2014-04-16

 
Automated LAN Cable Test System - Beta LaserMike 
Automated LAN Cable Testing Solution from Beta LaserMike and Keysight.

Solution Brief 2014-04-09

 
Impedance Matching for High Power Devices - Maury Microwave 
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Keysight

Solution Brief 2014-04-02

 
Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave 
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Keysight

Solution Brief 2014-04-02

 
Impedance and Network Analysis Application List Application Note 
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

应用说明 2012-10-30

是德成功测量阻抗的 8 点提示 应用指南 346-4 
是德成功测量阻抗的 8 点提示 应用指南 346-4。测量阻抗有几种不同的技术和方法,应该根据测量的频率范围、要测量的阻抗参数以及想要显示的测量结果来选择一个具体的测试技术。

应用说明 2011-12-31

Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed 
This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions.

应用说明 2009-02-03

PDF PDF 1.33 MB
Multifrequency C-V Measurements of Semiconductors (AN 369-5) 
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

应用说明 2008-12-10

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