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Boundary Scan Test Methods for DDR Memories  
In-circuit testing of DDR Memories has become increasingly difficult. This webcast discusses methods of DDR test development and debug.

교육 자료 2011-03-28

 
Surviving State Disruptions Caused by Test: the "Lobotomy Problem” 
Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing.

교육 자료 2010-12-21

 
Boundary Scan Online Training 
Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk!

교육 자료 2010-01-28

 
DfT rules for boundary scan during ICT 
Learn about the design for test rules for boundary scan used at in-circuit test, that can help you create a good test, minimizing the time and effort needed for debugging while maximizing the efficiency of your test.

교육 자료 2009-12-01

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