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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from Villanova University where Dr. Gang Feng and his students are studying how nanomaterials and their composites can help detect concussions.

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-12-01

 
Validating Automotive Ethernet Conformance and Performance - Case Study 
This case study explores how the BMW Group was successful in validating their automotive Ethernet toolchain, getting visibility into the performance and robustness of the switches integrated in ECUs.

Case Study 2017-11-03

PDF PDF 536 KB
IMECAS uses MBP to Create a PDSOI PN Junction Model 
Researchers from the Institute of Microelectronics of Chinese Academy of Sciences (IMECAS) have proposed a new simulation model for the PN junction based on SOI.

Case Study 2017-11-01

PDF PDF 391 KB
Hangzhou Dianzi University Uses IC-CAP to Extract a Novel, Small-Signal Model for Bulk FinFETs 
Case study on how Hangzhou Dianzi University created a novel compact model for bulk FinFETs that accommodates self-heating behaviors.

Case Study 2017-10-10

PDF PDF 1.12 MB
University Uses ADS to Create an Impedance Matching Method for Wireless Battery Charging  
Learn how NCKU created an impedance matching method for wireless battery charging using Keysight ADS.

Case Study 2017-10-07

PDF PDF 683 KB
The Difference Between Digitizers and Oscilloscopes for Wideband Measurements 

Article 2017-09-20

 
Full Function Oscilloscopes for ATE Systems 

Article 2017-09-20

 
5G: How Do You Test for a Standard that Doesn’t Even Exist? 
5G NR is ascending rapidly as the 5G technology of choice, but it turns out lots can be done to get ready as it goes through the formal 3GPP channels.

Article 2017-09-19

 
‘The Push and Pull of Technology Solutions for 5G’ Highlights WAMICON 2017 
The WAMICON 2017 Panel Session on 5G.

Article 2017-09-18

 
Make accurate and fast design decisions with data analytics 
Make accurate and fast design decisions with data analytics

Article 2017-08-25

 
Environment Aware Virtual Vehicle-To-Vehicle System Design  
ECN article by Wilfredo Rivas-Torres, PhD, Sr. EDA Application Engineer and Wenyan Ding, Sr. EDA EM Application Engineer at Keysight Technologies.

Article 2017-08-08

 
Mini ICT with VTEP Accurately Detects Solder Failure on SMT Connector - Case Study 
Find out how one customer reported reduction in bone pile and significant savings on scrap cost after using the Mini ICT systems with VTEP

Case Study 2017-07-24

PDF PDF 779 KB
Customizing Tables Just Got Easier with a New Python Module for MQA Software 
Working with data tables is a basic skill every engineer learns early on in their career. When organized properly, tables can summarize a great deal of device data into a helpful information format, and that makes them extremely useful.

Article 2017-07-12

 
i3070 Inline ICT Improves Functional Test Yield of SSDs - Case Study 
Find out how one customer reported first pass yield results of more than 95% with less than 0.5% false failures, after installing the i3070 Series 5 Inline ICT systems.

Case Study 2017-07-10

PDF PDF 610 KB
STMicroelectronics & ESEO Use ADS To Design a 2.45 GHz Wireless Power Scavenging Circuit 
Learn how STMicroelectronics and ESEO designed a 2.45 GHz wireless scavenging circuit using Advanced Design System (ADS).

Case Study 2017-06-07

PDF PDF 539 KB
Applying a Very Wide-Bandwidth Millimeter-Wave Testbed to Power Amplifier DPD 
5G designs that use wide-bandwidth digital modulation require new test technologies. Our latest 5G whitepaper presents a testbed for generating and analyzing millimeter-wave signals with 8 GHz bandwidth.

Article 2017-06-06

 
Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control 
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

Article 2017-05-31

 
S-parameters: Signal Integrity Analysis in the Blink of an Eye 
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

Article 2017-05-30

 
Solution Partner Newsletter Q2 2017 
Solution Partner Newsletter Q2 2017

Newsletter 2017-05-26

PDF PDF 969 KB
The Melting Trace Paradox 
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

Article 2017-05-24

 
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

Article 2017-05-08

PDF PDF 624 KB
SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases 
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

Article 2017-05-04

 
Villanova Professor and Students “Bang Heads” for Nanotechnology Research 
Dr. Gang Feng, Associate Professor in the Department of Mechanical Engineering at Villanova University, is using advanced materials measurement technology to understand concussions, energy storage, and more.

Article 2017-04-21

 
Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA 
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

Article 2017-04-01

PDF PDF 860 KB
STMicroelectronics and University of Lyon Predict EMI Using ADS - Case Study 
Learn how STMicroelectronics and University of Lyon designers used ADS to develop a network parameter block technique to satisfy their need for accurate and general EMI modeling.

Case Study 2017-03-17

PDF PDF 509 KB

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