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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from Villanova University where Dr. Gang Feng and his students are studying how nanomaterials and their composites can help detect concussions.

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BER Measurement Using Real-Time Oscilloscope Controlled from M8070A - Application Note  
The scope of this application note is to explain the BER measurement procedure using the M8045A pattern generator and DSAZ634A oscilloscope when controlled from M8070A system software.

Application Note 2017-12-13

PDF PDF 6.78 MB
Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-12-13

Practical Temperature Measurements (AN-290) 
This application note explores the more common temperature measurement techniques and introduces procedures for improving their accuracy.

Application Note 2017-12-13

PDF PDF 3.18 MB
Drive Connected, Drive Safe - White Paper 
A well-tested eCall/ERA-Glonass system meeting compliance standards at development phase can go on to help save lives and minimize injury aftermath in the event of accidents when cars hit the roads.

Application Note 2017-12-13

PDF PDF 2.33 MB
Optimize Power Source Integrity Under Large Load Transients - Application Note 
This application note discusses several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

Application Note 2017-12-11

PDF PDF 1.57 MB
Evaluate Lithium Ion Self-Discharge of Cells in a Fraction of the Time Traditionally Required 
This new way to determine a cell’s self-discharge by measuring its self-discharge current allows cells with excessively high self-discharge to be identified and isolated much quicker vs traditional open-circuit voltage approaches.

Application Note 2017-12-08

PDF PDF 1.57 MB
How to Make the Best Switch Mode Power Supply Measurements - Application Note 
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

Application Note 2017-12-07

Using FieldFox RF and Microwave Analyzers with Mass Storage Devices - Application Brief 
This document describes the capabilities of using FieldFox with mass storage devices for record keeping, transferring files, or copying limit lines, masks or cable correction files, etc.

Application Note 2017-12-06

PDF PDF 1.38 MB
Emerging Solutions to Hybrid & Electric Vehicle DC: DC Converter Design and Test - White Paper 
This paper discusses design and test challenges for DC:DC converters in electric vehicles (EV), and the new EV test solutions needed to reduce cost pressures and provide performance assurance.

Application Note 2017-12-05

PDF PDF 1.90 MB
Protect Against Power-Related DUT Damage During Test - Application Note 
This application note discusses choosing a power supply with extensive integrated protection features to avoid power-related damage.

Application Note 2017-12-04

Power Supply Testing - Application Note 
An electronic load offers a broad range of operating modes, providing versatile loading configurations needed for characterizing and verifying DC power supply design specifications.

Application Note 2017-12-04

Choosing the Best Passive and Active Oscilloscope Probes for Your Tasks - Application note 
Selecting the right probe for your application is the first step toward making reliable oscilloscope measurements, and each probe has an application for which it performs best.

Application Note 2017-12-01

CAN FD Eye-Diagram Mask Testing - Application Note 
Eye-diagram mask testing is used in a broad range of today’s serial bus applications. Learn more about eye-diagram testing for higher speed buses such as the new CAN FD serial bus.

Application Note 2017-12-01

Understanding the Programming Interfaces of PXI Instruments - Application Note 
This application note explains the differences between benchtop and PXI system architectures and programming interfaces to help you understand how to integrate PXI into benchtop systems.

Application Note 2017-12-01

Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-12-01

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2017-12-01

A Framework for Understanding: Deriving the Radar Range Equation - Application Note 
Radar scans three-dimensional space to gather information about detected objects such as location, shape and speed. This entire process is described in this app note by the radar range equation.

Application Note 2017-12-01

Noise and Noise Figure: Improving and Simplifying Measurements - Application Brief 
Noise is present in every electronic circuit. Noise disturbances can limit the overall performance of a wireless system, making noise measurements fundamental for all transmitter/receiver components.

Application Note 2017-12-01

PDF PDF 986 KB
Power Sources for Energy-Efficient High Input Voltage Telecommunications Equipment Development 
Telecommunications equipment developers face several challenges when selecting power sources for test systems for developing new telecommunications equipment for network installations employing high voltage power distribution.

Application Note 2017-11-30

How to Easily Create an Arbitrary Waveform Without Programming - Application Note 
Creating arbitrary waveforms on a modern function generator or arbitrary waveform generator (AWG) is not as difficult as you might think. Many engineers try to avoid creating arbitrary waveforms (arbs) at all costs. When they hear the word “arb“, they picture the tedious process of learning how to use some type of waveform software or, worse yet, having to write a program to generate a waveform and then remotely connecting to your AWG to upload the arb. With modern AWGs, creating an arbitrary waveform no longer has to be looked upon with doom and gloom.

Application Note 2017-11-27

PDF PDF 1.08 MB
8 Hints for Better Scope Probings - Application Note 
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2017-11-23

FFT and Pulsed RF Measurements with 3000T X-Series Oscilloscopes - Application Note 
Explore how FFT math functions and spectral views on a 3000T X-Series oscilloscope help to bring digital and RF designs to market.

Application Note 2017-11-23

Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials 
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.

Application Note 2017-11-21

PDF PDF 2.10 MB
Data Logging and Digitizing with a Digital Multimeter (DMM)—It’s about time! - Application Note 
Now -- data logging and digitizing optimized in a DMM for optimized front panel operation rathern than remote programming and data transfer.

Application Note 2017-11-16

PDF PDF 349 KB
OTA Test for Millimeter-Wave 5G NR Devices and Systems - White Paper 
This document discusses the challenges of over-the-air (OTA) testing and the associated test methods of millimeter-wave devices, including phased array technology, millimeter wave beamforming and beamsteering.

Application Note 2017-11-15

PDF PDF 2.27 MB

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