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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from Villanova University where Dr. Gang Feng and his students are studying how nanomaterials and their composites can help detect concussions.

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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2017-12-01

Evaluate Lithium Ion Self-Discharge of Cells in a Fraction of the Time Traditionally Required 
This new way to determine a cell’s self-discharge by measuring its self-discharge current allows cells with excessively high self-discharge to be identified and isolated much quicker vs traditional open-circuit voltage approaches.

Application Note 2017-10-06

PDF PDF 1.57 MB
Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2017-09-06

Understanding the Differences Between Oscilloscopes and Digitizers for Wideband Signal Acquisitions  
This white paper compares the use of oscilloscopes and wideband digitizers for wideband signal applications.

Application Note 2017-03-30

PDF PDF 6.16 MB
Accelerating Spurious Emission Measurements Using Fast-Sweep Techniques - Application Note 
Searching for spurious emissions can be especially difficult and time-consuming. Learn about techniques you can use to optimize and speed your measurements.

Application Note 2017-01-20

Spectrum Analysis Basics - Application Note 
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-11-02

Testing Automotive DC-DC converter with Keysight TS-8989 - Application Note 
This paper discusses emulation of input signals, load simulations and measurements for testing high-power automotive DC-DC converter electronic control units and the TS-8989 functional tester.

Application Note 2016-05-15

PDF PDF 880 KB
Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests 
Key considerations for designing a cost-effective high-power switching and load management automotive functional test solution.

Application Note 2016-02-22

PDF PDF 967 KB
TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2015-11-11

PDF PDF 2.87 MB
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note 
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

Application Note 2015-05-11

Radar Measurements - Application Note 
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-08-22

PDF PDF 6.84 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note 
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

Choosing the Test System Software Architecture - Application Note 
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note 
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note 
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
RS-232 Troubleshooting - Application Note 
In the course of dealing with personal computers, you may use the RS-232 serial interface. This application note will describe RS-232 at a basic level, with an orientation towards Windows®- based instrument programming.

Application Note 2013-07-31

PDF PDF 111 KB
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note 
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

Increasing Manufacturing Throughput of Automotive Controllers - Application Note 
This application note describes how automotive manufacturers can boost throughput using the Keysight TS-5400 Series 3 high performance PXI function test system for multiple devices under test.

Application Note 2013-04-18

PDF PDF 783 KB
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 
This application note discusses the unique challenges involved in minimizing noise figure.

Application Note 2013-01-31

Spectrum and Signal Analysis Pulsed RF Application Note 150-2 
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

Application Note 2012-07-05

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

Application Note 2012-04-30

Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note 
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

Application Note 2012-03-05

Switching Solutions 
This paper discusses Keysight's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

High-Performance Arbitrary Waveform Generation for RADAR and LIDAR Application 
Presentation given at the Aerospace and Defense Symposium in 2009. It covers radar principles and challenges, radar test systems, and Keysight solutions.

Application Note 2010-02-17

PDF PDF 1.32 MB
Creating Hardware Handler in C/C++ for Keysight TestExec SL 
A hardware handler enhances the Keysight TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL.

Application Note 2009-09-10

PDF PDF 181 KB

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