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Keysight PXIe Chassis Cooling Guidelines - White Paper 
Module temperatures in a PXI system can impact operating conditions. It’s important to actively manage the environment inside your chassis.

어플리케이션 노트 2018-08-27

PDF PDF 702 KB
89600 VSA Software - Brochure 
This 89600 VSA software brochure provides an overview of the 89600 VSA vector signal analysis software.

브로셔 2018-08-16

PDF PDF 2 MB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Data Sheet 
The Keysight 81160A is a pulse function arbitrary noise generator with 330 MHz pulses and 500 MHz sine waves. The unique functionality of this 4-in1 instrument increases test efficiency and confidence.

데이터시트 2018-08-08

EMI 인증 테스트 대 EMI 사전 인증 테스트 - 어플리케이션 개요(영어) 
이 백서는 스펙트럼 분석기가 있는 사내 EMI 사전 인증 테스트 실행의 장점에 대한 이해를 제공하고, 새로운 제품의 EMI 성능에 대해 충분한 평가를 수행하는 과정을 안내하며, 원치 않는 방출을 진단합니다.

어플리케이션 노트 2018-08-07

전도성 및 복사성 측정 수행 어플리케이션 노트(영어) 
이 어플리케이션 노트는 복사성 및 전도성 방출 측정 개요와 EMI 사전 인증 테스트에 대한 방법론을 제공합니다.

어플리케이션 노트 2018-08-06

Vector Network Analyzer - Selection Guide 
Keysight offers a variety of vector network analyzers with frequency, performance, and versatility to meet your measurement needs.

선택 가이드 2018-08-02

Design and Test Solutions for Medical IoT Devices - Solution Brochure 
This brochure highlights design and test solutions for medical IoT devices, including device test, wireless communications, network and systems.

브로셔 2018-07-10

PDF PDF 8.69 MB
i3070 Series 5i Inline In-Circuit Test System – Data Sheet 
Keysight’s i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

데이터시트 2018-06-12

CX3300 Series Device Current Waveform Analyzer - Data Sheet 
The CX3300 series is the world's first instrument that can precisely visualize low-level current waveforms you have never seen before by 14/16-bit dynamic range, max. 200 MHz bandwidth and low noise.

데이터시트 2018-05-31

Developing IEEE 1687 Tests on N1125A x1149 Boundary Scan Analyzer - Application Note 
This application note provides an overview of the IEEE 1687 standard and its implementation in board test. It then describes the steps to develop tests on x1149.

어플리케이션 노트 2018-05-25

PDF PDF 2.07 MB
Solving Your IoT Wireless Design and Test Challenges - Solution Brochure 
Many wireless standards have emerged to support a wide range of IoT applications. Get a quick glance of Keysight comprehensive wireless test solutions in this brochure. This includes Bluetooth, WLAN, ZieBee, Z-Wave, Wi-SUN, LoRa, NB-IoT and Cat-M1.

브로셔 2018-05-18

PDF PDF 5.39 MB
E5052B Signal Source Analyzer - Brochure 
This 16-page brochure describes the features and benefits of the E5052B (10 MHz to 7 GHz, 26.5 GHz, or 110 GHz) Signal Source Analyzer. The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

브로셔 2018-05-15

PDF PDF 11.23 MB
CX3300 Series Device Current Waveform Analyzer - Product Fact Sheet 
The CX3300 series is the world's first instrument that can precisely visualize low-level current waveforms you have never seen before by 14/16-bit dynamic range, max. 200 MHz bandwidth and low noise.

브로셔 2018-05-11

PDF PDF 1.08 MB
Testing Automotive DC-DC converter with Keysight TS-8989 - Application Note 
This paper discusses emulation of input signals, load simulations and measurements for testing high-power automotive DC-DC converter electronic control units and the TS-8989 functional tester.

어플리케이션 노트 2018-04-12

PDF PDF 781 KB
N9038A MXE EMI Receiver - Brochure 
This brochure an overview of the features and functionality in the N9038A MXE EMI receiver.

브로셔 2018-03-27

PDF PDF 1.39 MB
Power Consumption Solutions for Battery-Operated Medical Devices - Application Brief 
This application brief is to describe different type of Keysight's solutions in measuring power consumption for battery operated medical devices.

어플리케이션 노트 2018-03-20

Measuring Frequency Response with E5061B LF Network Analyzer 
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

어플리케이션 노트 2018-02-22

x1149 Boundary Scan Analyzer - Data Sheet 
The Keysight x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

데이터시트 2018-02-20

E4980A Precision LCR Meter 20 Hz to 2 MHz - Product Fact Sheet 
This two-page quick fact sheet highlights the key features and specifications for E4980A Precision LCR Meter.

판촉 자료 2018-02-08

PDF PDF 986 KB
Accelerate debug and evaluation of IoT devices by current profile analysis - Application Note 
You can solve the IoT device development challenges and dramatically improve the development efficiency and quality with current profile measurement with a Device Current Waveform Analyzer.

어플리케이션 노트 2018-01-19

PDF PDF 3.98 MB
신호 분석 측정 기초, 노이즈 플로어 최적화, 해상도 대역폭 등(영어) 
탁월한 통찰력을 위해 신호 분석을 최적화하기 위한 측정 기초를 알아보십시오.

어플리케이션 노트 2017-12-13

TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

어플리케이션 노트 2017-12-12

PDF PDF 2.69 MB
Optimize Power Source Integrity Under Large Load Transients - Application Note 
This application note discusses several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

어플리케이션 노트 2017-12-11

PDF PDF 1.57 MB
Effective Multitap Transformer Testing Using a Scanner (AN 1224-5) 
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Keysight 4263B LCR Meter.

어플리케이션 노트 2017-12-05

TS-8989 PXI Functional Test System - Brochure 
The TS-8989 PXI functional tester helps you achieve a lower cost of test for automotive electronic control units and industrial electronics.

브로셔 2017-12-05

PDF PDF 692 KB

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