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MTEK Series - Legacy ATE SystemTester Upgrade Kit  
MTEK Series - Legacy ATE System Upgrade -Keysight Technologies and Marvin Test Solutions. Easily extend the life of your legacy semiconductor ATE with this low-cost, PXI-based, add-on solution

手册 2017-09-16

PDF PDF 451 KB
Test Challenges and Keysight Solutions for IoT Smart Devices 
IoT smart devices have become increasingly prevalent in our daily lives and bring unique challenges for designers and manufacturers. Keysight has a complete portfolio to address the test challenges.

手册 2017-08-17

PDF PDF 2.62 MB
x1149 Pin Constraints Feature - Technical Overview 
This overview describes how the pin constraints feature can improve boundary scan test coverage and perform debugging, eliminating manual BSDL file editing and test regeneration.

技术总览 2017-08-14

PDF PDF 1.10 MB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

应用说明 2017-07-31

PDF PDF 1.38 MB
Keysight Instant Buy - Product Fact Sheet 
Keysight Instant Buy offers you a monthly installment plan so you can get the latest measurement technology without harming your cash flow.

手册 2017-07-25

PDF PDF 889 KB
BT2152A Self-Discharge Analyzer - Data Sheet 
The BT2152A provides revolutionary reduction in the time required to discern good vs. bad cell self-discharge performance in manufacturing.

产品资料 2017-07-18

Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note 
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

应用说明 2017-07-05

PDF PDF 2.47 MB
E5052B Signal Source Analyzer - Data Sheet 
This 21-page data sheet provides technical specifications for the E5052B (10 MHz to 7 GHz) signal source analyzer and the E5053A Downconverter (3 GHz to 26.5 GHz). The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

产品资料 2017-06-12

PDF PDF 2.11 MB
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

文章 2017-05-08

PDF PDF 624 KB
Real-Time Printed Circuit Board EMC Measurement 
Co-branded Solutions Partner brochure with EMSCAN on Real-Time Printed Circuit Board EMC Measurement

手册 2017-04-26

PDF PDF 552 KB
Real-Time Printed Circuit Board EMC Measurement - EMSCAN 
Real-Time Printed Circuit Board Electromagnetic Compatibility Measurement from EMSCAN and Keysight

Solution Brief 2017-04-26

 
Integrated RF Test Solution 
Co-branded Solutions Partner brochure with Marvin Test Solutions on Integrated RF Test Solution

手册 2017-04-25

PDF PDF 236 KB
Real-Time Near-Field Cell Phone and Tablet Antenna Measurements – EMSCAN 
Real-Time Near-Field Cell Phone and Tablet Antenna Measurements from Keysight Technologies and EMSCAN

Solution Brief 2017-04-20

 
Real-Time Near-Field Measurement of Antenna Characteristics 
Co-branded Solutions Partner brochure with EMSCAN on Real-Time Antenna Measurements

手册 2017-04-20

PDF PDF 440 KB
Real-Time Near-Field Cell Phone and Tablet Antenna Measurements 
Co-branded Solutions Partner brochure with EMSCAN on Real-Time Near-Field Cell Phone Antenna Measurements.

手册 2017-04-20

PDF PDF 575 KB
Real-Time Measurement of Antenna Characteristics - EMSCAN 
Real-Time Measurement of Antenna Characteristics from EMSCAN and Keysight

Solution Brief 2017-04-20

 
TestExec SL 8.1 - Data Sheet 
TestExec SL is a test executive software designed for high-volume, high throughput functional test applications across multiple industries.

产品资料 2017-04-12

PDF PDF 1023 KB
Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA 
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

文章 2017-04-01

PDF PDF 860 KB
i3070 In-Circuit Test System Onsite Agreement - Data Sheet 
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

产品资料 2017-03-22

PDF PDF 728 KB
是德科技 校准服务 助您满怀信心地执行测量并成功通过审核 
是德科技 校准服务 助您满怀信心地执行测量并成功通过审核

手册 2017-02-23

PDF PDF 504 KB
推动世界科技加速发展 
推动世界科技加速发展

手册 2017-02-16

PDF PDF 5 MB
Understanding x1149 Integrity Test - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

应用说明 2017-02-16

PDF PDF 2.48 MB
The Advantage of Universal Inputs in Data Acquisition Systems - Application Brief 
Learn how the 34970A/34972A DAQ system offers the versatility and powerful functionality you need to solve your most pressing test challenges.

应用说明 2017-02-03

PDF PDF 809 KB
FPGA Implementation of a Digital-PLL Using FPGAflow - Application Note 
This application note demonstrates the capabilities of Keysight M3300A AWG and digitizer PXIe combo module to implement closed-loop controls

应用说明 2017-01-05

极大限度延长低功耗物联网智能设备的电池使用寿命  
探索能够延长物联网设备电池使用寿命的创新方法。执行精确的电池消耗分析,精确测试物联网的低功耗并表征关键设备(如无线医疗设备)的电池使用寿命。(233 char w spaces)

挑战与机遇 2016-10-20

 

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