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In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - achieve your best design

Achieve signal integrity in high-speed design with these useful tools, demos, videos and more

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N5399C, N5399D HDMI Electrical Performance Validation and Compliance Software - Data Sheet 
Keysight's N5399C and N5399D HDMI electrical performance validation and compliance software gives you a fast and easy way to verify and debug your High Definition Multi-media Interface (HDMI) designs.

Folha de Dados 2018-04-02

PDF PDF 3.91 MB
MIPI® DigRFSM v4 (M-PHY®) Protocol Triggering and Decode - Technical Overview 
It introduces how the MIPI DigRF v4 protocol decode application enables faster and better development of wireless mobile products employing the MIPI technology.

Visão Técnica 2018-03-23

PDF PDF 1.16 MB
Infoline Instrument Management Security, Reliability and Privacy - Product Fact Sheet 
Trust in the security, reliability and privacy of Keysight Infoline Instrument Management application.

Brochura 2018-03-19

PDF PDF 171 KB
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Publicação 2018-03-05

 
N5990A Test Automation Software Platform - Data Sheet 
An efficient test strategy is a proven competitive advantage. Keysight's N5990A Test Automation Software Platform is a key element of winning strategies.

Folha de Dados 2018-02-28

PDF PDF 6.23 MB
Practical Application of the InfiniiSim Waveform Transformation Toolset - Application Note 
This final paper puts together the concepts and theory already presented in the preceding papers. It presents and addresses five common problems that confront engineers.

Nota de aplicação 2018-02-23

Using De-embedding Tools for Virtual Probing - Application Note 
Discusses using de-embedding tools to gain virtual access to difficult measurement points

Nota de aplicação 2018-02-23

x1149 Boundary Scan Analyzer - Data Sheet 
The Keysight x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

Folha de Dados 2018-02-20

N4880A Reference Clock Multiplier - Data Sheet 
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.

Folha de Dados 2018-02-13

PDF PDF 2.35 MB
BER Measurement Using Real-Time Oscilloscope Controlled from M8070A - Application Note  
The scope of this application note is to explain the BER measurement procedure using the M8045A pattern generator and DSAZ634A oscilloscope when controlled from M8070A system software.

Nota de aplicação 2017-12-13

PDF PDF 6.78 MB
U7243A USB 3.0 Superspeed Electrical Performance Validation - Data Sheet 
The USB 3.0 electrical test software allows you to automatically execute USB 3.0 electrical tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test

Folha de Dados 2017-12-02

86100D-9FP PAM-N Analysis Software for 86100D DCA-X Oscilloscopes - Data Sheet 
The 86100D-9FP PAM-N analysis software for 86100D DCA-X Series oscilloscopes helps you quickly and accurately analyze electrical and optical Pulse Amplitude Modulated (PAM) signals.

Folha de Dados 2017-12-01

PDF PDF 3.32 MB
How to Address USB Type-C™ Transmitter and Receiver Test Challenges - Application Note 
Understanding the USB Type-C and USB 3.1 transmitter and receiver test challenges can help to ensure successful USB Type-C integration and test for devices.

Nota de aplicação 2017-12-01

How to Correlate USB Type-C Simulation and Measurement - Application Note 
Upgrading or integrating USB Type-C into a device is complex. To avoid costly hardware prototyping cycles and identify problems early, perform simulation of the design for compliance testing.

Nota de aplicação 2017-12-01

Debugging Signal Integrity and Protocol Layers on DDR Designs 
As DDR data transmission rates increase, signal integrity and clarity become critical concerns. So one of the primary challenges with DDR is debugging failures.

Nota de aplicação 2017-12-01

PDF PDF 4.16 MB
One Size Does NOT Fit All - Application Note 
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

Nota de aplicação 2017-12-01

DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate 
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Nota de aplicação 2017-12-01

PDF PDF 1.76 MB
DDR Probing for Physical Layer and Functional Testing - Application Note 
Probing is the key to accessing signals and validating your designs. Although you may normally probe at signal vias or designed-in probe points, for DDR these do not always provide good signal integrity.

Nota de aplicação 2017-12-01

PDF PDF 3.12 MB
DDR Memory Overview, Development Cycle, and Challenges - Technical Overview 
Thanks to improved manufacturing processes that have driven down costs, the technology of choice is now DDR SDRAM, short for Double Data Rate Synchronous Dynamic Random Access Memory.

Nota de aplicação 2017-12-01

PDF PDF 1.42 MB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Visão Técnica 2017-12-01

PDF PDF 550 KB
Separating Read/Write Signals for DDR DRAM and Controller Validation - Application Note 
To analyze the signal integrity of DDR signals, you need to differentiate the complex traffic on the data bus to independently analyze the signal performance for both DDR chip and memory controller.

Nota de aplicação 2017-12-01

PDF PDF 3.37 MB
Technology Refresh Services for X-Series Signal Analyzers - Flyer 
2-page flyer that explains and links to X-Series signal analyzer Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting.

Materiais promocionais 2017-12-01

PDF PDF 926 KB
U7238A MIPI D-PHY Compliance Test Software for Infiniium Oscilloscopes - Application Note 
Keysight Technologies' U7238A MIPI D-PHY compliance test software for Infiniium oscilloscopes gives you a fast, easy way to validate and debug your embedded D-PHY data links.

Folha de Dados 2017-12-01

Technology Refresh Services for V-Series, Z-Series Oscilloscopes - Flyer 
2-page flyer that explains and links to V-Series,Z-Series Oscilloscopes Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting.

Materiais promocionais 2017-12-01

PDF PDF 699 KB
Technology Refresh Services for FieldFox Handheld Analyzers - Flyer 
2-page flyer that explains and links to FieldFox handheld analyzers Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting

Materiais promocionais 2017-12-01

PDF PDF 1.40 MB

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