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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

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Learn more about Digital Design & Interconnect solutions from Keysight. 

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High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Introducing Physics-Based VCSEL Model to Solve Challenges in Designing Rack-to-Rack Opto Links 
Agilent introduces a physics-based model for its opto model library that quickly and accurately solves the challenges posed by signal distortion in vertical cavity surface emitting lasers (VCSELs) used in rack-to-rack opto links.

Press Materials 2013-10-23

 
Agilent Technologies’ Advanced Design System Selected by Kamstrup to Develop Smart Metering System 
Agilent announces that Kamstrup A/S, a provider of metering solutions for electricity, heat, water and natural gas, has selected Agilent's Advanced Design System (ADS).

Press Materials 2013-10-07

 
Keysight EEsof EDA Premier Communications Design Software 
The Keysight EEsof EDA catalog provides an excellent overview of all of Keysight's Electronic Design Automation (EDA) tools.

Catalog 2013-10-07

PDF PDF 8.61 MB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief 
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
U4301A PCI Express® 3.0 Analyzer Module - Data Sheet 
Keysight's U4301A PCI Express® 3.0 analyzer module is a protocol analyzer supporting all PCIe applications from Gen1 - Gen3 and speeds from 2.5 GT/s (Gen1) - PCI 8 GT/s (Gen3), link widths X1-X16.

Data Sheet 2013-09-04

M9252A DigRF Host Adapter – Data Sheet 
The M9252A DigRF Host Adapter provides the serial stimulus capabilities required for the MIPITM Alliance DigRF v4-based RFIC evaluation and characterization.

Data Sheet 2013-08-07

PDF PDF 565 KB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note 
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Agilent Technologies to Demonstrate Products at EMC 2013 
Agilent announce that it will demonstrate some of its key products at EMC 2013, the IEEE International Symposium on Electromagnetic Compatibility, Aug. 5-9 at the Denver Convention Center (Booth 830), in Denver, Colorado.

Press Materials 2013-07-29

 
Agilent Technologies Announces Next-Generation MIPI M-PHY Protocol Analyzer for Mobile Computing App 
Agilent Technologies Announces Next-Generation MIPITM M-PHY Protocol Analyzer for Mobile Computing Applications

Press Materials 2013-06-18

 
Agilent Introduces Electrical Retimer Solution to Solve Challenges in Designing Chip-to-Chip Links 
Agilent introduces the latest addition to its repeater model library for quickly and accurately solving the challenge posed by signal distortion in the multigigabit-per-second regime.

Press Materials 2013-05-29

 
Agilent Technologies Announces High-Speed Digital Seminar Tour with Micron 
Agilent announces its 2013 High-Speed Digital Tour, covering more than 20 locations throughout Europe.

Press Materials 2013-05-28

 
Keysight Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests 
Keysight Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Keysight E5071C ENA Option TDR

Application Note 2013-05-21

PDF PDF 2.13 MB
U4611A/B USB 2.0/3.0 Protocol Analyzer - Data Sheet 
The U4611A/B USB 2.0/3.0 Protocol Analyzer helps designers of USB devices test and isolate problems in their devices and system designs.

Data Sheet 2013-05-21

Ethernet 10GBASE-T Cable Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 10GBASE-T Ethernet Cable Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2013-05-21

PDF PDF 2.17 MB
N5393A PCI Express® 3.0 (Gen3) Software for Infiniium Oscilloscopes - Data Sheet 
Keysight Technologies N5393C PCI Express electrical performance validation and compliance software provides you with a fast and easy way to verify and debug your PCI Express designs for add-in cards and motherboard systems. The PCI Express electrical test software allows you to automatically execute PCI Express electrical checklist tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test.

Data Sheet 2013-05-07

ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System 
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management

Press Materials 2013-05-07

 
PCI Express® Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of PCI Express® Compliance Testing by using the Keysight E5071C ENA Option TDR.

Technical Overview 2013-04-24

PDF PDF 3.29 MB
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test 
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2013-04-24

PDF PDF 2.02 MB
MOI for DisplayPort PHY CTS 1.2b Source Testing  
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 5.63 MB
MOI for DisplayPort PHY CTS 1.2b Sink Tests 
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 7.99 MB
Tips for Making Better Memory Measurements – Video Series 
Videos that show customers how perform a comprehensive, unique and extensive analysis in less time.

Demo 2013-03-18

 
Agilent Technologies Launches Recognition Program for EDA Experts 
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

Press Materials 2013-03-12

 
MHL Cable Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of MHL (Mobile High-definition Link) Cable Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2013-02-22

PDF PDF 2.06 MB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note 
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB

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