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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Learn more about Digital Design & Interconnect solutions from Keysight. 

Keysight RF and Digital Learning Center - A commitment to learning with industry experts 
 

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Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note 
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2017-01-11

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note 
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note 
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview 
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

PDF PDF 1.94 MB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note 
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes – Application Note 
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

Application Note 2014-07-31

Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note 
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note 
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Crossing the Digital-Analog Divide - White Paper 
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

Application Note 2012-05-02

PDF PDF 6.46 MB
S-parameter Series: Using the Time-Domain Reflectometer Application Note 
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

Application Note 2012-03-01

6 Hints for Better SATA and SAS Measurements 
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Application Note 2012-02-02

PDF PDF 1.59 MB
Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface 
Keysight continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals.

Application Note 2011-12-22

PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note 
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Techniques for Higher Accuracy Optical Measurements - Application Note 
Learn techniques for high accuracy optical measurements using System Impulse Response Correction

Application Note 2011-09-21

Using the Keysight Infiniium Series Real-time Oscilloscope to Validate the DigRF 
The DigRF v3 standard presents new digital hardware validation challenges for mobile wireless development as the links between the baseband (BB) ICs and the radio frequency (RF) ICs transition from an analog interface to a digital interface.

Application Note 2009-05-27

A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses 
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate synchronous dynamic random access memory) signals.

Application Note 2008-09-10

Precision Waveform Analysis for High-Speed Digital Communications - Application Note 
This document will discuss the Keysight 86108A precision waveform analyzer plug-in module with the Keysight 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals.

Application Note 2008-04-17

Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes 
Traditional debugging can be time consuming and inefficient. With Keysight Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

Application Note 2008-01-30

Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding 
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Solving Jitter Problems through Jitter Spectrum and Phase Noise Analysis 
Product Note

Application Note 2007-05-09

Precision Jitter Analysis Using the Keysight 86100C DCA-J - Application Note 
This product note provides a guide to making jitter measurements with the Keysight 86100C DCA-J.

Application Note 2007-03-07

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note 
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications 
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3) 
Debugging USB 2.0 Systems

Application Note 2006-10-05

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