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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Learn more about Digital Design & Interconnect solutions from Keysight. 

Keysight RF and Digital Learning Center - A commitment to learning with industry experts 
 

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-12-01

 
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

Demo 2017-10-31

 
Technical Experts Discuss, Demonstrate Latest EM Compatibility Techniques, SI Solutions at EMC 2017 
Keysight's electromagnetic (EM) and signal (SI) and power integrity (PI) experts will be available at the 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (EMC 2017) to discuss a range of topics.

Press Materials 2017-08-02

 
Time & Frequency Domain Simulation-to-Measurement Techniques by Mike Resso 
This presentation discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices.

Demo 2017-06-18

 
Sierra Circuits Interviews Heidi Barnes at DesignCon 
During DesignCon 2017, Sierra Circuits interviewed Heidi Barnes, Senior Applications Engineer at Keysight Technologies and recipient of the DesignCon Engineer of the Year Award.

Demo 2017-06-07

 
S-parameters: Signal Integrity Analysis in the Blink of an Eye 
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

Article 2017-05-30

 
Power Integrity Ecosystem by Heidi Barnes from Keysight  
This Power Integrity overview provides an understanding of power integrity, why it is important, how to design for it, and it teaches techniques for high-fidelity simulation, analysis and measurement.

Demo 2017-05-29

 
The Melting Trace Paradox 
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

Article 2017-05-24

 
Keysight Technologies to Present a Vision for 5G Evolution at WAMICON 2017  
Keysight experts will be at WAMICON 2017, an annual IEEE Wireless and Microwave Conference, to discuss everything from circuit-level modeling to system verification for general RF, microwave, millimeter wave for 4G, emerging 5G communications, and aerospace & defense.

Press Materials 2017-04-10

 
How to Design for Power Integrity: DC-DC Converter Modeling and Simulation 
This video describes how to create an accurate DC-DC Converter measurement based model (MBM) from just a few simple measurements.

How-To Video 2017-04-07

 
W1714 SystemVue AMI Modeling Kit, W1713 SystemVue SerDes Model Library  
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.

Data Sheet 2017-03-21

Ensuring High Signal Quality in PCIe Gen3 Channels 
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Article 2017-03-14

 
Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model 
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Journal 2017-03-04

 
Heidi Barnes: DesignCon 2017 Engineer of the Year 
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

Article 2017-02-23

 
Signal and Power Integrity Products & Options Summary  
Signal and Power Integrity Products & Options Summary

Selection Guide 2017-02-22

 
Keysight Technologies Announces Heidi Barnes as the 2017 DesignCon Engineer of the Year 
Keysight is proud to announce that Heidi Barnes, a senior applications engineer for Keysight EEsof EDA's high-speed digital applications, was today announced as the 2017 DesignCon Engineer of the Year.

Press Materials 2017-02-02

 
Keysight to Address IoT, Digital, RF Test Challenges at embedded world 2017 
Keysight Technologies announces it will exhibit a number of new products at the embedded world 2017 (www.embedded-world.de/en), Stand 4-208, ECN, Nuremberg, Germany, March 14–16

Press Materials 2017-01-30

 
Keysight Technologies Addresses 400G/PAM-4 Test Challenges at DesignCon 2017 
See the latest design and test solutions solve today’s toughest measurement challenges and accelerate new product development.

Press Materials 2017-01-17

 
How to Design for Power Integrity: Measuring, Modeling, Simulating Capacitors and Inductors 
This video shows how to make capacitor and inductor measurements efficiently and how to use the results directly or create high fidelity measurement based models for simulation in Advanced Design System (ADS).

How-To Video 2016-11-07

 
8 Steps to a Successful DDR4 Design 
Learn how Keysight's design flow example for DDR4 can help you achive confidence in your design and help you ensure success.

Journal 2016-10-20

 
The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete 
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

Demo 2016-10-11

 
A Quick Fix for Poor Capacitor, Inductor and DC/DC Impedance Measurements  
Modern Test & Measure article by Steve Sandler (Picotest) explains why you need an extended range, partial S2p measurement and how to make this improved measurement.

Article 2016-10-03

 
Best Practices for Connector Models 
Eric Bogatin, Signal Integrity Journal Editor, discusses best practices for connector modeling and measuring with Heidi Barnes, Keysight ADS application engineering specialist, and Jim Nadolny, Principle SI Engineer for Samtec.

Article 2016-09-30

 
Unlocking Millimeter Wave Insights 
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

Demo 2016-09-30

 
Correlating simulation and measurement for a USB Type-C reference channel (Part 1) 
This article from Electronic Products discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices.

Article 2016-09-21

 

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