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Application Information About Specific Components & Devices

76-100 of 108

Low Cost Antenna Test – Eretec Inc. 
Low Cost Antenna Test Solution from Eretec and Keysight

Solution Brief 2014-04-16

On-Wafer Test of Power Devices 
On-Wafer Test Solution for Power Semiconductor Devices from Cascade Microtech and Keysight

Solution Brief 2014-04-16

Pulsed Measurement of Active Device IV Characteristics and S-Parameters - Maury Microwave 
Pulsed Measurement of Active Device IV Characteristics and S-Parameters from Maury Microwave and Keysight

Solution Brief 2014-04-02

Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note 
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note 
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

Considerations in Making Small Signal Measurements - Application Brief 
The increasing demand for battery-powered mobile devices and energy-efficient green products has triggered a rising demand for a scope measurement solution that can measure the small signals.

Application Note 2013-10-29

Realization and Analysis of Electronically Steerable Phased Array using Scripting & Parameterization 
With the advent of multi-core, high speed processors and abundant memory availability, complex designs using 3-D full-wave electromagnetic (EM) tools have become common choice for microwave and antenna engineers.

Article 2013-07-09

Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note 
The new N2820A Series high-sensitivity current probes from Keysight Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

Application Note 2013-02-26

Impedance and Network Analysis Application List Application Note 
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

Application Note 2012-10-30

Keysight's EMPro and Momentum Selected by OSAT for Next-Generation Circuit and Antenna Development 
OSAT Company, which specializes in engineering analysis, testing and inspection techniques, is using Keysight’s Electromagnetic Professional software, EMPro, and the Momentum 3-D planar electromagnetic simulator to design and simulate innovative new antennas and circuits.

Press Materials 2012-02-24

Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers 
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

Application Note 2012-02-08

Reducing Measurement Times in Antenna and RCS Applications 
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.

Application Note 2010-12-20

Solutions for Antenna Characterization 
Learn how to fully evaluate the performance of your antennas in significantly less time with Keysight's solutions for antenna characterization.

Brochure 2010-06-30

Network Parameter Measurement: Best Practices using the Keysight Medalist i3070 
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Keysight Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

Quad Flat No Lead (QFN) Best Practices 
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Application Note 2008-08-26

The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment 
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

Application Note 2007-10-31

Tips for X-ray Users On Exporting NDF’s With No Loads Set To False 
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.

Application Note 2007-10-18

Making the Most of Keysight Throughput Multiplier on Medalist In-Circuit Test Systems 
Keysight Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.

Application Note 2007-10-12

X-ray Test Users Utilize BOM Explorer to Change  
Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested".

Application Note 2007-10-12

Medalist SP50 User Tips for Nominal Paste Factor Field  
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.

Application Note 2007-10-11

PNA - Antenna/RCS - Reduce Measurement Test Times 
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.

Application Note 2004-12-20

Magneto-Optical Disk Drive Research (PN 3) - Application Note 
This 4-page Product Note describes how the Keysight 81100 family of pulse/pattern generators can be used together with a Keysight Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

PNA - Antenna - Pulsed Measurements 
This paper presents advances in the instrumentation techniques that can be used for the measurement and characterization of antennas that are to be tested in a pulsed mode of operation.

Application Note 2004-01-06

Triggering PNA Microwave Network Analyzers for Antenna Measurements – Application Note 

Application Note 2003-05-28

Performing Two-Tone Measurements with the Keysight 8360 (PN 8360-4) 
This Product Note illustrates how to use two Keysight 8360 synthesized sweepers to obtain two tracking signals offset by a fixed frequency (fixed offset).

Application Note 2001-01-11


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