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Introducing the 2016 Advanced Low-Frequency Noise Analyzer 
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

基本演示 2016-07-18

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

内部通讯 2016-07-14

 
优酷网站上的电力电子设计和仿真视频 
优酷网站上关于使用 EDA 工具进行电力电子设计和仿真的视频。

基本演示 2016-07-12

 
How to Model Nonlinear Magnetics 
This video shows how to model nonlinear magnetic components as part of a complete switching convertor circuit simulation.

视频演示 2016-05-27

 
Testing Automotive DC-DC converter with Keysight TS-8989 - Application Note 
This paper discusses emulation of input signals, load simulations and measurements for testing high-power automotive DC-DC converter electronic control units and the TS-8989 functional tester.

应用说明 2016-05-15

PDF PDF 880 KB
Low-Frequency Noise Measurements with the E4727A and Their Applications 
This application note covers noise basics (1/f and white), applications of noise measurements and analysis, and how noise measurement challenges are addressed by the E4727A A-LFNA.

应用说明 2016-04-28

PDF PDF 2.39 MB
Keysight Announces Strategic Collaboration with San'an-IC to Release PDKs for HBT, pHEMT Processes 
Keysight announces that it has signed a memorandum of understanding (MoU) with Xiamen San'an Integrated Circuit Co. Ltd. (San'an-IC) to collaborate on an advanced process design kits (PDKs) for its HBT and pHEMT processes based on Advanced Design System (ADS) software.

新闻资料 2016-04-22

 
Keysight Announces Series of "How to Design an RF Power Amplifier" Videos for PA Designers 
Keysight EEsof EDA has released a series of five RF power amplifier (PA) design videos intended to provide engineers with the building blocks to design more complex PA classes (i.e., A, AB, B, F, E and J).

新闻资料 2016-04-20

 
Keysight Premium Used - Flyer 
Keysight Premium Used offers you a vast selection of high-quality test equipment, re-manufactured to like-new specifications and appearance.

手册 2016-04-18

PDF PDF 283 KB
Keysight Trade-In - Flyer 
Keysight Premium Used instruments undergo a comprehensive final inspection as this flyer explains.

手册 2016-04-18

PDF PDF 330 KB
是德科技 X1149 边界扫描分析仪 
是德科技 X1149 边界扫描分析仪

产品资料 2016-04-18

Technology Refresh Services for V-Series, Z-Series Oscilloscopes - Flyer 
2-page flyer that explains and links to V-Series,Z-Series Oscilloscopes Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting.

促销资料 2016-04-12

PDF PDF 1.25 MB
How to Accurately Measure and Validate S-Parameters for Transistor Modeling 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

视频演示 2016-04-04

 
Keysight to Demonstrate Innovative Test Solutions for Power Conversion Device/System Design at APEC 
Keysight announces it will demonstrate innovative design and test solutions at the Applied Power Electronics Conference and Exposition (APEC), Long Beach Convention & Entertainment Center, Booth 1252, Long Beach, Calif., March 20-24.

新闻资料 2016-03-18

 
Analog Devices Sys-Parameter Library for Keysight’s Genesys Software Significantly Eases RF Design 
Analog Devices, Inc. (ADI) announces the release of an extensive RF amplifier library of Sys-Parameters models for Keysight Technologies, Inc.’s Genesys RF simulation and synthesis software.

新闻资料 2016-03-17

 
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note 

应用说明 2016-03-11

PDF PDF 7.96 MB
Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests 
Key considerations for designing a cost-effective high-power switching and load management automotive functional test solution.

应用说明 2016-02-22

PDF PDF 967 KB
Keysight Unveils Latest Release of its Device Modeling and Characterization Software Tool Suite 
Keysight announces the newest release of its industry-leading device modeling and characterization software suite: IC-CAP 2016, MBP 2016, and MQA 2016.

新闻资料 2016-02-22

 
Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint 
Early implementation of BST can cut test costs and time.

文章 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint 
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

文章 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint 
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

文章 2016-02-16

PDF PDF 409 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint 
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

文章 2016-02-12

PDF PDF 178 KB
How to Model RF Passive Devices: Spiral Inductors 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

视频演示 2016-02-11

 
Genesys Overview 
Genesys continues to offer the industry’s most powerful RF circuit and system synthesis capabilities in an affordable, accurate and easy-to-use simulation software that you’ve come to love. Keysight Sys-Parameters provide breakthrough convenience in using component datasheet parameters such as amplifier P1dB, IP3, gain and noise figure over frequency, temperature and bias for simulation without the need to create custom files and equations.

基本演示 2016-02-11

 
Testing the Internet of Things - Article Reprint 
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

文章 2016-02-09

PDF PDF 79 KB

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