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RF Back to Basics Seminar 
Various dates and locations

Séminaire

 
Automotive and Energy Seminar Series 
Various dates and locations 2017/2018

Séminaire

 
International Microwave Symposium (IMS) 2017 
June 4 - 9, 2017; Honolulu, Hawaii

Salon professionnel

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EDA Customer Education and Services.

Matériel de formation 2017-08-08

 
Test at Breakneck Speeds with System Power Supplies Webcast 
Original broadcast March 30, 2017

Webcast - enregistré

 
Fundamentals of IV Measurements Webcast 
Original broadcast February 8, 2017

Webcast - enregistré

 
2017 Keysight EEsof EDA Training Course Calendar 
Scheduled Keysight EEsof courses for the United States and Canada

Formation en classe

 
Using WaferPro Express with B2200A Switch Matrix 
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Présentation de séminaire 2016-12-21

PDF PDF 2.35 MB
Accuracy matters: Calibration Options for Lab Standards Webcast 
Original broadcast May 19, 2016

Webcast

 
Multiport and Multi-site Test Optimization Techniques Webcast 
Original broadcast June 3, 2015

Webcast - enregistré

 
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast 
Original broadcast September 4, 2014

Webcast - enregistré

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

Webcast - enregistré

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

Webcast - enregistré

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - enregistré

 
MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Présentation de séminaire 2013-10-22

PDF PDF 1.48 MB
Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Présentation de séminaire 2013-10-22

 
Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Présentation de séminaire 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Présentation de séminaire 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training 
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Formation en classe