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Limited Access Tools Improve Test Coverage - Article Reprint 
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

文章 2010-10-20

PDF PDF 275 KB
The Proposed IEEE Test Standards - Article Reprint 
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

文章 2010-10-20

PDF PDF 2.83 MB

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