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Application Information About Specific Components & Devices

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E4980A Precision LCR Meter 20 Hz to 2 MHz - Brochure 
This brochure provides an overview, specifications and ordering information for the E4980A Precision LCR Meter.

Brochure 2017-08-18

PDF PDF 3.64 MB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Technical Overview 2017-03-10

PDF PDF 634 KB
Impedance Measurement Handbook - 6th Edition - Application Note 
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2016-11-02

B2980A Series Femto/Picoammeter and Electrometer/High Resistance Meter - Data Sheet 
The B2980A series is the world's only picoammeter/electrometer that confidently measures down to 0.01 fA current and 10 Pohm high resistance.

Data Sheet 2016-03-03

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer 
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

Application Note 2015-10-05

MEMS On-wafer Evaluation in Mass Production - Application Note 
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

Application Note 2015-08-27

Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A - Application Note 
This application brief describes the benefits of using the Keysight 4294A for device characterization of MEMS piezoelectric sensors and actuators, along with its wide variety of analysis functions and features and how it improves design efficiency.

Application Note 2015-08-26

Accelerate Your MEMS Device Development & Manufacturing Efficiency Using Impedance Test Instruments 
This brochure describes a general overview of Keysight’s capabilities in MEMS device testing and generates awareness of Keysight impedance MEMS test solution to customer.

Brochure 2015-08-25

PDF PDF 1.70 MB
Nanomeasurement Instruments for Industry R&D - Brochure 
This brochure discusses nanomeasurement instruments for industry R&D.

Brochure 2015-04-08

PDF PDF 1.53 MB
The Role of a Compact Low Voltage FE-SEM in MEMS Analysis - Application Note 
Overview of the 8500 high resolution imaging for MEMS devices without the need for metal coating to dissipate charge buildup.

Application Note 2015-03-11

PDF PDF 5.66 MB
Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A 
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

Application Note 2007-04-13

Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A 
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

Application Note 2007-04-12

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A 
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

Application Note 2007-04-04

Characterizing Electromagnetic MEMS Optical Scanner using the E4980A 
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

Application Note 2007-04-04