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RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Electromagnetic Compatibility, EMC Pre-Compliance Testing – TDK RF Solutions 
Electromagnetic Compatibility Pre-compliance Testing Solution from TDK RF Solutions and Keysight

Brefs de solution 2014-05-07

 
Millimeter-Wave FCC Part 15 Transmitter Compliance – OML 
Millimeter-Wave FCC Part 15 Transmitter Compliance Test Solution from OML and Keysight

Brefs de solution 2014-05-07

 
Millimeter-wave S-parameter measurements – OML 
Millimeter-wave S-parameter measurements from OML and Keysight

Brefs de solution 2014-05-07

 
Agilent Technologies Acquires Electrothermal Analysis Technology from Gradient Design Automation 
Agilent announces its acquisition of electrothermal analysis technology from Gradient Design Automation, the maker of HeatWave electrothermal analysis software.

Dossier de presse 2014-04-30

 
Magnetic Material Characterization – KEYCOM 
Magnetic Material Characterization Solution from KEYCOM and Keysight.

Brefs de solution 2014-04-30

 
X-Parameter Design Simulation Models - Modelithics 
X-Parameter Design Simulation Models from Modelithics and Keysight.

Brefs de solution 2014-04-30

 
Electromagnetic Compatibility, EMC CISPR Compliance Measurements – ETS-Lindgren 
Electromagnetic Compatibility CISPR Compliance Measurement Solution from ETS-Lindgren and Keysight

Brefs de solution 2014-04-29

 
EMC Test for R&D – Eretec Inc. 
EMC Test Solution for R&D from Eretec and Keysight

Brefs de solution 2014-04-16

 
Low Cost Antenna Test – Eretec Inc. 
Low Cost Antenna Test Solution from Eretec and Keysight

Brefs de solution 2014-04-16

 
On-Wafer High Power Load Pull Measurements – bsw TestSystems 
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Keysight

Brefs de solution 2014-04-16

 
Microwave Measurement and Calibration - ATE Systems 
Microwave Measurement and Calibration Solution from ATE Systems and Keysight.

Brefs de solution 2014-04-09

 
X-Parameter Measurements - Maury Microwave 
X-Parameter (large signal S-parameter) measurements from Maury Microwave and Keysight

Brefs de solution 2014-04-02

 
Millimeter-Wave Noise Figure and Noise Parameter Measurements – Maury Microwave 
Millimeter-Wave Noise Figure and Noise Parameter Measurements from Maury Microwave and Keysight.

Brefs de solution 2014-04-02

 
Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave 
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Keysight

Brefs de solution 2014-04-02

 
Impedance Matching for High Power Devices - Maury Microwave 
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Keysight

Brefs de solution 2014-04-02

 
Noise Parameter Measurements - Maury Microwave 
Noise Parameter vs Noise Figure Measurement from Maury Microwave and Keysight

Brefs de solution 2014-04-01

 
ADS 30-Second Demos 
Watch these videos to learn about popular usability improvements we’ve made in Advanced Design System (ADS) to increase your productivity.

Démonstration de base 2014-03-06

 
Agilent Technologies Unveils New 30-Second Demo Series of User-Inspired ADS 2014 Innovations 
Agilent announces the launch of a new series of 30-second demos on user-inspired innovations to its Advanced Design System 2014 software, the industry’s leading electronic design automation software for RF, microwave and signal-integrity applications.

Dossier de presse 2014-03-06

 
Agilent Software Gives Students Edge in Job Market 
Design tools are getting University of Arizona engineering students certifiably ready for work in the RF and microwave industry.

Dossier de presse 2014-02-24

 
ADS 2014 Dramatically Improves Design Productivity and Efficiency 
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Dossier de presse 2014-02-20

 
M9018A PXIe Chassis 18-Slots, 3U, 8GB/s - Data Sheet 
This data sheet describes the capability and advantages of the M9018A PXIe Chassis.

Fiche signalétique 2014-02-11

Agilent Technologies Simulation and Modeling Software Selected by Nitronex for High-Power GaN Design 
Agilent announces that Nitronex, a GaAs labs company and leading producer of GaN-on-silicon RF power devices, has selected Agilent to provide a complete GaN design flow that spans both device modeling and circuit simulation.

Dossier de presse 2014-02-11

 
On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note 
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.

Notes d’application 2014-02-06

Agilent Technologies’ LinkedIn ADS User Group Tops 3,000 Members 
Agilent announces that the Agilent EEsof EDA Advanced Design System (ADS) user group on LinkedIn now has over 3,000 members.

Dossier de presse 2014-02-03

 
ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Dossier de presse 2014-01-27

 

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