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Using S-Parameter Data Effectively 
This Article by Wilfredo Rivas-Torres focuses on how to incorporate Sparameters in the design process using a CAD approach.

記事 2014-07-31

PDF PDF 248 KB
Using SystemVue to Integrate a Flexible R&D Testbed for LTE - Application Note 
This application note describes an integrated solution for testing wireless communication systems based on the quickly evolving LTE standard.

アプリケーション・ノート 2014-07-31

PDF PDF 1.08 MB
Designing RFID Tags Using Direct Antenna Matching 
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

記事 2014-07-31

PDF PDF 1.09 MB
Symmetric and Asymmetric - Coupled Lines Band-Stop Filters at Ku/Ka Bands 
This Article presents theory and design of coupled-line spur line band-stop filters, which are quite compact structures, lower radiation loss than conventional shunt stub and coupled-line filters.

記事 2014-07-31

PDF PDF 1.38 MB
New LDMOS Model Delivers Powerful Transistor Library - Part 2 
This article reprint presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

記事 2014-07-31

PDF PDF 699 KB
RF SiP Design Verification Flow with Quadruple LO Down Converter SiP  
This article reprint by HeeSoo Lee and Dean Nicholson outlines the design flow used for a System-in-Package component, using multiple die integrated into a single packaged device.

記事 2014-07-31

PDF PDF 505 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 1 
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

記事 2014-07-31

PDF PDF 544 KB
Design and Characterization of Discontinuous RF/Microwave Passive Components 
This Article by Dean Nicholson presents a design methodology proposed for designing and building RF circuits likely to contain discontinuous regions.

記事 2014-07-31

PDF PDF 1.43 MB
Digital Predistortion Linearizes Wireless Power Amplifiers 
This Article by Wan-Jong Kim, Shawn P. Stapleton, Jong Heon Kim, and Cory Edelman focuses on how digital predistortion linearizes wireless power amplifiers.

記事 2014-07-31

PDF PDF 1.81 MB
Keysight SystemVueを使用したレーダーシステムの設計と干渉解析 
このアプリケーションノートでは、レーダーシステムの設計およびジャマー/干渉解析用のKeysight SystemVueソフトウェアの機能について紹介します

アプリケーション・ノート 2014-07-31

Accurate Simulation Models Yield High-Efficiency Power Amplifier Design 
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

記事 2014-07-31

PDF PDF 592 KB
No-Cost, Six-Month Availability of Modelithics COMPLETE Library for Genesys 2014 
Extensive Model Library Enables Exceptional Accuracy with Genesys RF Simulation Software.

プレス資料 2014-07-28

 
New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

プレス資料 2014-06-30

 
Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution 
EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer. The new modeling and simulation capability reduces development time for research and design validation teams working on early system prototyping and development of advanced multichannel applications.

プレス資料 2014-06-17

 
Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design 
Keysight announces the latest release of Genesys 2014.

プレス資料 2014-05-27

 
Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions 
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

プレス資料 2014-05-21

 
Radiated and Conducted Immunity Testing – TOYO Corporation 
Radiated and Conducted Immunity Test Solutions from TOYO and Keysight

ソリューション概要 2014-05-14

 
Electromagnetic Compatibility, EMC Pre-compliance Testing – TOYO Corporation 
Electromagnetic Compatibility Pre-compliance Test Solutions from TOYO and Keysight.

ソリューション概要 2014-05-14

 
RF Test Solutions – WinSoft 
Military and Commercial RF Test Solutions from WinSoft and Keysight.

ソリューション概要 2014-05-14

 
Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation 
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

プレス資料 2014-05-08

 
Electromagnetic Compatibility, EMC CISPR Compliance Measurements – TDK RF Solutions 
Electromagnetic Compatibility CISPR Compliance Measurement Solution from TDK RF Solutions and Keysight

ソリューション概要 2014-05-07

 
Millimeter-wave signal generator – OML 
Millimeter wave signal generator from OML and Keysight

ソリューション概要 2014-05-07

 
Electromagnetic Compatibility, EMC Pre-Compliance Testing – TDK RF Solutions 
Electromagnetic Compatibility Pre-compliance Testing Solution from TDK RF Solutions and Keysight

ソリューション概要 2014-05-07

 
Millimeter-Wave FCC Part 15 Transmitter Compliance – OML 
Millimeter-Wave FCC Part 15 Transmitter Compliance Test Solution from OML and Keysight

ソリューション概要 2014-05-07

 
Millimeter-wave S-parameter measurements – OML 
Millimeter-wave S-parameter measurements from OML and Keysight

ソリューション概要 2014-05-07

 

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