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RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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GoldenGate RFIC Overview 
This video shows some of the capabilities that make Keysight's GoldenGate RFIC software the most trusted simulation, verification and analysis solution available for RF integrated circuit design within versions 5 and 6 of the Cadence Virtuoso design environment.

Demo 2014-08-01

 
Integrated Design-to-Test Flow for Complex Radar/EW Systems 
This video demonstrates a new integrated design-to-test flow for complex radar/EW systems. Customize FPGAs in M9703A digitizer using SystemVue design software.

Demo 2014-08-01

 
What's New in Genesys 2009.04? 
This video demonstrates the major new features in Genesys 2009.04. Completely new: Momentum GXF full featured NlogN, multithreaded EM solver, three new 3D viewers - 3D layout viewer, 3D current viewer and 3D antenna far field pattern viewer, new part properties and graph properties windows for easier part and graph management and ADS nonlinear model support

Demo 2014-08-01

 
Wideband Digital Pre-Distortion with Keysight SystemVue & PXI Modular Instrument - Application Note 
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

EMPro Overview Video on YouTube 
Electromagnetic Professional (EMPro) Overview Video in Keysight EEsof EDA's Channel on YouTube™

Demo 2014-08-01

 
AC Simulation in Advanced Design System 
This video tutorial describes how to set up and run AC simulations in ADS including controller setup, sources, budget analysis, frequency conversion and other miscellaneous information.

Demo 2014-08-01

 
Symmetric and Asymmetric - Coupled Lines Band-Stop Filters at Ku/Ka Bands 
This Article presents theory and design of coupled-line spur line band-stop filters, which are quite compact structures, lower radiation loss than conventional shunt stub and coupled-line filters.

Article 2014-07-31

PDF PDF 1.38 MB
Design and Characterization of Discontinuous RF/Microwave Passive Components 
This Article by Dean Nicholson presents a design methodology proposed for designing and building RF circuits likely to contain discontinuous regions.

Article 2014-07-31

PDF PDF 1.43 MB
Designing RFID Tags Using Direct Antenna Matching 
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

Article 2014-07-31

PDF PDF 1.09 MB
Using S-Parameter Data Effectively 
This Article by Wilfredo Rivas-Torres focuses on how to incorporate Sparameters in the design process using a CAD approach.

Article 2014-07-31

PDF PDF 248 KB
RF SiP Design Verification Flow with Quadruple LO Down Converter SiP  
This article reprint by HeeSoo Lee and Dean Nicholson outlines the design flow used for a System-in-Package component, using multiple die integrated into a single packaged device.

Article 2014-07-31

PDF PDF 505 KB
Digital Predistortion Linearizes Wireless Power Amplifiers 
This Article by Wan-Jong Kim, Shawn P. Stapleton, Jong Heon Kim, and Cory Edelman focuses on how digital predistortion linearizes wireless power amplifiers.

Article 2014-07-31

PDF PDF 1.81 MB
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design 
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

Article 2014-07-31

PDF PDF 592 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 1 
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

Article 2014-07-31

PDF PDF 544 KB
State of the Art in EM Software for Microwave Engineers - White Paper 
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

New LDMOS Model Delivers Powerful Transistor Library - Part 2 
This article reprint presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

Article 2014-07-31

PDF PDF 699 KB
No-Cost, Six-Month Availability of Modelithics COMPLETE Library for Genesys 2014 
Extensive Model Library Enables Exceptional Accuracy with Genesys RF Simulation Software.

Press Materials 2014-07-28

 
New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

 
Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution 
EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer. The new modeling and simulation capability reduces development time for research and design validation teams working on early system prototyping and development of advanced multichannel applications.

Press Materials 2014-06-17

 
Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design 
Keysight announces the latest release of Genesys 2014.

Press Materials 2014-05-27

 
Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions 
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Press Materials 2014-05-21

 
Radiated and Conducted Immunity Testing – TOYO Corporation 
Radiated and Conducted Immunity Test Solutions from TOYO and Keysight

Solution Brief 2014-05-14

 
RF Test Solutions – WinSoft 
Military and Commercial RF Test Solutions from WinSoft and Keysight.

Solution Brief 2014-05-14

 
Electromagnetic Compatibility, EMC Pre-compliance Testing – TOYO Corporation 
Electromagnetic Compatibility Pre-compliance Test Solutions from TOYO and Keysight.

Solution Brief 2014-05-14

 
Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation 
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

Press Materials 2014-05-08

 

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