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RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Parasitic Reduction Tool Enhances RFIC Simulation Speed, Capacity While Preserving Accuracy 
Keysight announces Jivaro-for-GoldenGate, a parasitic model order-reduction tool designed for GoldenGate.

Press Materials 2008-11-04

 
IHP Announces SiGe Process Design Kit (SG25H3) for Use with Keysight's ADS 
Innovations for High Performance Microelectronics (IHP), Frankfurt (Oder), Germany, today announced the availability of a leading-edge ADS process design kit (PDK) for IHP’s 0.25µm SiGe process (SG25H3).

Press Materials 2008-10-27

 
Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit 
This paper discusses how Keysight's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

Keysight Technologies' GoldenGate Simulator Chosen by Toshiba for RFIC Design, Evaluation 
September 25, 2008 Press Release: Keysight Technologies' GoldenGate Simulator Chosen by Toshiba for RFIC Design, Evaluation

Press Materials 2008-09-25

 
Large-Signal LDMOS Model Simulation Using Keysight Genesys 
This application note guides the user through simulation of DC IV, S-parameters and swept power data of an LDMOS transistor (NEC NE5511279A) using Keysight Genesys software.

Application Note 2008-08-21

 
Data Mining 12-Port S-Parameters 

Application Note 2008-08-11

PDF PDF 830 KB
U2000 Series USB Power Sensors - Flyer 
This is a 4-page flyer that highlights the key features and specifications of the U2000 Series USB power sensors.

Brochure 2008-07-16

PDF PDF 504 KB
Keysight Introduces Breakthrough Technology to Analyze Nonlinear Behaviors of Active Components 

Press Materials 2008-06-02

 
New Test Methodologies Improve EMI Testing Efficiency 
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.

Application Note 2008-05-28

PDF PDF 801 KB
MMIC Design: Speed to Market with the Lowest Cost and Highest Yield 
This Article by Jack Sifri (Keysight Tech.) brings out the five important steps that are key elements of a successful MMIC Design process, in order to satisfy the speed to market at the lowest cost.

Article 2008-05-15

PDF PDF 1.58 MB
10 Hints for Getting the Most from your Frequency Counter 
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements.

Application Note 2008-04-18

PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

Application Note 2007-11-28

Keysight Technologies Announces Productivity Breakthroughs with ADS 2008 EDA Software 
Keysight Technologies Announces Productivity Breakthroughs with Advanced Design System 2008 EDA Software

Press Materials 2007-11-13

 
External waveguide mixing and millimeter wave measurements with PSA Spectrum Analyzers (AN 1485) 

Application Note 2007-10-25

Momentum GX Electromagnetic Simulation for Genesys 

Brochure 2007-09-18

PDF PDF 233 KB
Making Compliance Measurements with the N9039A-Based EMI Measurement Receiver 

Application Note 2007-08-15

PDF PDF 1.58 MB
Backplane Differential Channel Microprobe Characterization in time and Frequency Domains 

Application Note 2007-05-09

PDF PDF 769 KB
Achive First-Pass LTCC Design Success With DFM 
Understanding the effects of process and component variations can help in constructing LTCC circuit designs that deliver desired performance levels in spite of those variations.

Article 2007-05-01

PDF PDF 2.43 MB
Flexible Software-Defined Test Instruments 
This Article by Greg Jue presents the next generation of software defined test instruments; a key element in cost control, time to market, design flexibility and standards evolution.

Article 2006-11-01

PDF PDF 1.95 MB
Polyharmonic Distortion Modeling - Article Reprint 

Application Note 2006-06-01

PDF PDF 2.67 MB
4 Steps for Making Better Power Measurements (AN 64-4D) - Application Note 
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Application Note 2006-04-26

Stripline TRL Calibration Fixtures for 10-Gigabit Interconnect Analysis 

Application Note 2006-04-05

Introduction to the Fixture Simulator Function of the ENA Series RF Network Analyzers 
This product note describes what the fixture simulator of the ENA Series is, and how it helps customers in various network measurement applications. The fixture simulator function includes de-embedding, embedding, and balanced measurements.

Application Note 2006-03-13

Accurate Simulation Models Yield High Efficiency Power Amplifier Design 
In this Paper, an accurate nonlinear transistor model is shown to form the basis for a systematic simulation-based design procedure for a microwave power amplifier.

Technical Overview 2005-12-01

PDF PDF 238 KB
Power Amplifier Design Speed-Up Techniques 
This Article presents how to speed up Power Amplifier Design by fast source-pull, real-time load-pull and accurate measurement-based behavioural models.

Article 2005-11-01

PDF PDF 1.71 MB

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