您可能感興趣的網頁。 觀看搜尋結果:

 

聯絡是德專家

射頻和微波

針對您的射頻和微波量測需求,提供相關應用說明和解決方案的完整資訊。

請務必檢查應用說明資料庫,獲得測試設備操作的詳細資訊,以協助您成功完成您需要的量測。

是德科技射頻和數位學習中心 - 由產業專家傾囊相授

縮小範圍

依產業/技術

依內容類型

依產品分類

376-400 / 553

排序:
X-parameters Aid MMIC Design 
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

專文 2010-07-15

 
Solutions for MIMO RF Test and Debug 
Ensuring Quick and Accurate Four-Channel, Phase-Coherent MIMO Measurements

應用手冊 2010-07-14

PDF PDF 300 KB
Electromagnetic Interference Meets Its Match 
NVIDIA Summer 2010 article on how gaming-inspired 3D glasses and a GPU-accelerated simulation using Agilent's EMPro impact products we use every day.

專文 2010-06-24

 
Agilent Announces United Microelectronics Corporation Certification of GoldenGate Software 

新聞資料 2010-06-04

 
Agilent's Latest RF/Microwave Design Genesys Software Features Breakthrough X-Parameters Technology 

新聞資料 2010-05-17

 
Evaluating Tributary Jitter from the SDH Network (AN 1258) 
The new SDH lightwave transmission network offers many advantages through the use of synchronous multiplexing. During the changeover between traditional asynchronous and the new synchronous networks, there will be many interfaces between the two. This can lead to accumulation of timing jitter...

應用手冊 2010-05-11

PDF PDF 398 KB
Maximizing revenue with in-service testing - centralized testing/monitoring systems (AN 1237-2) 
This Application Note which is the first in a series, provides background information on the European digital transmission hierarchy, higher-rate multiplexing, framing structure and justification. It is intended as a reference for other Application Notes in a series looking at ways for PTTs to...

應用手冊 2010-05-11

PDF PDF 486 KB
A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals 
Model memory effects of microwave amplifiers in the case of wideband modulated signals.

應用手冊 2010-05-05

PDF PDF 616 Bytes
Agilent Technologies’ GoldenGate Software Selected by RF Integration for Advanced RFIC Development 

新聞資料 2010-04-05

 
Fundamentally Changing Nonlinear Microwave Design 
Provides an overview of the invention and need for X-parameters to model the behavior of non-linear devices. This is an article was originally from Microwave Journal, Issue March 2010, Vol.53. No.3

專題報導 2010-03-09

 
Radar System Design and Interference Analysis Using Keysight SystemVue 
This application note outlines key value propositions of Keysight SystemVue software for Radar System design and jammer/interferer analysis.

應用手冊 2010-03-03

Agilent Technologies Announces YouTube Channel for Agilent EEsof EDA 
Channel Features More than 100 Videos with Subtitles in 50 Languages.

新聞資料 2010-01-19

 
ACCO Semiconductor chooses Agilent RFIC Solutions Software for Next-Generation CMOS Power Amplifier 
GoldenGate is the most trusted simulation, verification and analysis solution available for integrated RF circuit design within the Cadence Virtuoso design flow.

新聞資料 2010-01-11

 
Agilent Technologies' New GoldenGate Release 4.4 Accelerates Advanced Node CMOS RFIC Design 

新聞資料 2009-12-08

 
Accelerating Advanced Node CMOS RFIC Design 
Microwave Journal article by David Vye

專文 2009-12-07

 
Constant Power-Delivered Load Pull Simulation 
Video series demostrating the power and flexibility of MMIC desktop tools in ADS.

基本展示 2009-10-26

 
WIN Semiconductors Announces New MMIC Tool Bar Personality for ADS Process Design Kits 

新聞簡訊 2009-10-23

 
Agilent Technologies Announces MMIC Tool Bar Personality for United Monolithic Semiconductors’ pHEMT 

新聞資料 2009-09-30

 
在電路級設計上產生 X 參數的展示影片 
此系列的展示影片分為四個部分,展示了如何在電路上產生 X 參數。

基本展示 2009-09-28

 
Agilent Technologies' Genesys Software Speeds Sennheiser's High-End Audio Receiver Development  

新聞資料 2009-09-25

 
Agilent Technologies Unveils Newest Solutions for Microwave, RF, Wireless, Radar Test 
At the 2009 European Microwave Conference.

新聞資料 2009-09-22

 
X-parameters News 
Press Releases related to Agilent's X-parameters

新聞資料 2009-08-21

 
Solutions for Characterizing and Designing Linear Active Devices 
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.

應用手冊 2009-08-21

Solutions for Addressing SDR Design and Measurement Challenges 
This "solutions for" application brief discusses how to use COTS technology and an integrated design-to-test flow to quickly develop optimal SDRs.

應用手冊 2009-08-03

PDF PDF 986 KB
MMIC Design Seminar Videos for ADS 
A collection of Keysight EEsof EDA ADS video demos for MMIC Design

基本展示 2009-07-14

 

上一個 ... 11 12 13 14 15 16 17 18 19 20 ... 下一頁