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Using Analog/RF X-Parameter Models in System-Level Design  
This tutorial video shows how X-parameter* models can be used in SystemVue system-level designs. This unites measured RF components with Baseband DSP and algorithm design in a single top-down design flow.

基本展示 2012-08-22

 
Videos for Integrating Design and Test for Wireless 
Examples of Keysight RF workflow environment on YouTube

基本展示 2012-08-21

 
Videos for Integrating Design and Test  
Examples of Keysight RF workflow environment on YouTube

基本展示 2012-08-21

 
Design, simulation and measurement automation 
Link to Electronic Products and Technology article discussing the marrying of both electronic design automation (EDA) tools and processes with measurement for system level design and verification.

專文 2012-08-10

 
磁性材料特性分析 
KEYCOM 和 Keysight 共同提供的磁性材料特性分析解決方案

解決方案簡介 2012-08-06

 
Reconfigurable Radar Design: Debug and Validation - video 
This video demonstrates how to debug and validate reconfigurable radar design with Keysight test and measurement instruments and software.

基本展示 2012-07-30

 
Agilent to Demonstrate Test Solutions at International Symposium on Electromagnetic Compatibility 
Agilent will demonstrate its test solutions at the IEEE International Symposium on Electromagnetic Compatibility in Pittsburg, Aug. 5-10, 2012.

新聞資料 2012-07-18

 
Testing Radar and EW Systems for the Real-World 
The solutions described in this Microwave Journal article do more than address a wide range of present and future radar systems: They also help overcome organizational hurdles.

專文 2012-07-12

 
Spectrum and Signal Analysis Pulsed RF Application Note 150-2 
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

應用手冊 2012-07-05

Agilent Technologies Collaborates with Thales to Apply X-parameters* Technology to RF System Design 
Agilent announces that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications.

新聞資料 2012-06-20

 
Agilent Extends Partnership with AMCAD to Include Nonlinear Modeling and Measurement Services 
Agilent announces that its long-term relationship with AMCAD Engineering has been extended to include a technology partnership for services related to nonlinear design and measurement of new electronic devices.

新聞資料 2012-06-19

 
Advanced Design System Selected by Sivers IMA for Front-to-Back Silicon RFIC Implementation 
Agilent announces that Sivers IMA, a leading European manufacturer of microwave products for telecommunications, industrial, and test and measurement applications, has selected ADS 2011 EDA platform for complete silicon-based RFIC/MMIC implementation.

新聞資料 2012-06-19

 
IBM adds back-end PDK support for Agilent Technologies’ Advanced Design System Software 
IBM announces the availability of a full front-to-back PDK for its popular SiGe BiCMOS 8HP technology. The PDK was developed for use with ADS 2011 and enables both IBM and Agilent customers to take full advantage of the industry’s most comprehensive RF and microwave design platform.

新聞資料 2012-06-18

 
ON Semiconductor Offers High-Q™ IPD Process Design Kit for Advanced Design System Software 
ON Semiconductor Corporation, a premier supplier of high performance silicon solutions for energy efficient electronics, announces the availability of a full front-to-back process design kit (PDK) for its High-Q™ Integrated Passive Device process. The PDK was developed for use with Agilent Technologies’ Advanced Design System (ADS) 2011 EDA software and enables both ON Semiconductor and Agilent customers to take full advantage of the industry’s most comprehensive RF and microwave design platform.

新聞資料 2012-06-18

 
Product How To: Design a polar frequency discriminator 
Polar frequency discriminators (PFD) are widely used in radar and direction-finding applications to determine the unknown frequency of incoming pulses. This article explains how to design the RF portion of a PFD, over a frequency range of 2 to 8 GHz, using Agilent’s ADS software.

專文 2012-06-08

 
How to design a high-performance scope: One team’s approach 
EE Times Design Article on how an Agilent Technologies design team discovers some valuable lessons that could prove useful for any designer or design team looking for success on their next project.

專文 2012-06-07

 
GLOBALFOUNDRIES Qualifying GoldenGate and Momentum Simulators for its RF CMOS Processes 
GLOBALFOUNDRIES announces support for Agilent's GoldenGate RFIC circuit and Momentum 3D planar electromagnetic (EM) simulators for its 65nm Low Power enhanced (LPe) RF CMOS process.

新聞資料 2012-06-04

 
Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS 
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.

新聞資料 2012-06-04

 
Agilent Technologies' Newest GoldenGate Software Release Accelerates Design Verification 
Agilent announced the latest release of its RFIC simulation, verification and analysis software, GoldenGate 2012.

新聞資料 2012-06-04

 
X-FAB Qualifies GoldenGate and Momentum Simulators for its 0.35 Micrometer CMOS Process Family 
X-FAB Silicon Foundries, a leading foundry group for analog/mixed-signal semiconductor applications, announces support for GoldenGate RFIC circuit and Momentum 3D planar EM simulators for X-FAB's 0.35 micrometer modular analog/mixed-signal technology with RF capability and high-voltage extensions.

新聞資料 2012-06-04

 
毫米波 FCC Part 15 發射器相符性測試 
OML 與是德的毫米波 FCC Part 15 發射器相容性測試解決方案。

解決方案簡介 2012-05-26

 
ENA series network analyzer based PIM and S-parameter measurement solution - QFS 
This quick fact sheet introduces the key features of innovative solution with the ENA series that combines passive intermodulation (PIM) and S-parameter measurement capabilities.

促銷資料 2012-05-25

PDF PDF 608 KB
Cyntec Expands its Libraries Offering for Use with Advanced Design System 2011 Software Release 
Cyntec Co., LTD, Hsinchu, announced the availability of an Advanced Design System (ADS) model library for Cyntec’s RF Chip inductors, CML0510 & CML0306 Series.

新聞資料 2012-05-15

 
Designing Scalable 10G Backplane Interconnect Systems 
This Paper presents techniques for design which significantly reduce modeling requirements for the design of high-speed backplanes in conjunction with advanced testing techniques which provide maximum channel characterization with the minimum amount of time.

技術總覽 2012-05-05

PDF PDF 1.46 MB
ADS Selected by Comtech EF Data for Satellite Communications, High-Frequency Power Amplifier Design 
Agilent announces that Comtech EF Data, a subsidiary of Comtech Telecommunications Corp., has selected ADS for use in developing RF and microwave circuits for high-performance satellite communications systems.

新聞資料 2012-04-25

 

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