您可能感興趣的網頁。 觀看搜尋結果:

 

聯絡是德專家

射頻和微波

針對您的射頻和微波量測需求,提供相關應用說明和解決方案的完整資訊。

請務必檢查應用說明資料庫,獲得測試設備操作的詳細資訊,以協助您成功完成您需要的量測。

是德科技射頻和數位學習中心 - 由產業專家傾囊相授

縮小範圍

依產業/技術

依內容類型

依產品分類

201-225 / 552

排序:
Designing RFID Tags Using Direct Antenna Matching 
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

專文 2014-07-31

PDF PDF 1.09 MB
State of the Art in EM Software for Microwave Engineers - White Paper 
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

應用手冊 2014-07-31

New LDMOS Model Delivers Powerful Transistor Library - Part 1 
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

專文 2014-07-31

PDF PDF 544 KB
Design and Characterization of Discontinuous RF/Microwave Passive Components 
This Article by Dean Nicholson presents a design methodology proposed for designing and building RF circuits likely to contain discontinuous regions.

專文 2014-07-31

PDF PDF 1.43 MB
New LDMOS Model Delivers Powerful Transistor Library - Part 2 
This article reprint presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

專文 2014-07-31

PDF PDF 699 KB
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design 
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

專文 2014-07-31

PDF PDF 592 KB
RF SiP Design Verification Flow with Quadruple LO Down Converter SiP  
This article reprint by HeeSoo Lee and Dean Nicholson outlines the design flow used for a System-in-Package component, using multiple die integrated into a single packaged device.

專文 2014-07-31

PDF PDF 505 KB
No-Cost, Six-Month Availability of Modelithics COMPLETE Library for Genesys 2014 
Extensive Model Library Enables Exceptional Accuracy with Genesys RF Simulation Software.

新聞資料 2014-07-28

 
New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

新聞資料 2014-06-30

 
Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution 
EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer. The new modeling and simulation capability reduces development time for research and design validation teams working on early system prototyping and development of advanced multichannel applications.

新聞資料 2014-06-17

 
Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design 
Keysight announces the latest release of Genesys 2014.

新聞資料 2014-05-27

 
Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions 
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

新聞資料 2014-05-21

 
Radiated and Conducted Immunity Testing – TOYO Corporation 
Radiated and Conducted Immunity Test Solutions from TOYO and Keysight

解決方案簡介 2014-05-14

 
Electromagnetic Compatibility, EMC Pre-compliance Testing – TOYO Corporation 
Electromagnetic Compatibility Pre-compliance Test Solutions from TOYO and Keysight.

解決方案簡介 2014-05-14

 
RF Test Solutions – WinSoft 
Military and Commercial RF Test Solutions from WinSoft and Keysight.

解決方案簡介 2014-05-14

 
Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation 
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

新聞資料 2014-05-08

 
Millimeter-wave S-parameter measurements – OML 
Millimeter-wave S-parameter measurements from OML and Keysight

解決方案簡介 2014-05-07

 
Electromagnetic Compatibility, EMC CISPR Compliance Measurements – TDK RF Solutions 
Electromagnetic Compatibility CISPR Compliance Measurement Solution from TDK RF Solutions and Keysight

解決方案簡介 2014-05-07

 
Millimeter-wave signal generator – OML 
Millimeter wave signal generator from OML and Keysight

解決方案簡介 2014-05-07

 
Electromagnetic Compatibility, EMC Pre-Compliance Testing – TDK RF Solutions 
Electromagnetic Compatibility Pre-compliance Testing Solution from TDK RF Solutions and Keysight

解決方案簡介 2014-05-07

 
Agilent Technologies Acquires Electrothermal Analysis Technology from Gradient Design Automation 
Agilent announces its acquisition of electrothermal analysis technology from Gradient Design Automation, the maker of HeatWave electrothermal analysis software.

新聞資料 2014-04-30

 
X-Parameter Design Simulation Models - Modelithics 
X-Parameter Design Simulation Models from Modelithics and Keysight.

解決方案簡介 2014-04-30

 
Electromagnetic Compatibility, EMC CISPR Compliance Measurements – ETS-Lindgren 
Electromagnetic Compatibility CISPR Compliance Measurement Solution from ETS-Lindgren and Keysight

解決方案簡介 2014-04-29

 
On-Wafer High Power Load Pull Measurements – bsw TestSystems 
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Keysight

解決方案簡介 2014-04-16

 
Low Cost Antenna Test – Eretec Inc. 
Low Cost Antenna Test Solution from Eretec and Keysight

解決方案簡介 2014-04-16

 

上一個 1 2 3 4 5 6 7 8 9 10 ... 下一頁