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RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Flexible Software-Defined Test Instruments 
This Article by Greg Jue presents the next generation of software defined test instruments; a key element in cost control, time to market, design flexibility and standards evolution.

Article 2006-11-01

PDF PDF 1.95 MB
Polyharmonic Distortion Modeling - Article Reprint 

Application Note 2006-06-01

PDF PDF 2.67 MB
4 Steps for Making Better Power Measurements (AN 64-4D) - Application Note 
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Application Note 2006-04-26

Stripline TRL Calibration Fixtures for 10-Gigabit Interconnect Analysis 

Application Note 2006-04-05

Introduction to the Fixture Simulator Function of the ENA Series RF Network Analyzers 
This product note describes what the fixture simulator of the ENA Series is, and how it helps customers in various network measurement applications. The fixture simulator function includes de-embedding, embedding, and balanced measurements.

Application Note 2006-03-13

Accurate Simulation Models Yield High Efficiency Power Amplifier Design 
In this Paper, an accurate nonlinear transistor model is shown to form the basis for a systematic simulation-based design procedure for a microwave power amplifier.

Technical Overview 2005-12-01

PDF PDF 238 KB
Power Amplifier Design Speed-Up Techniques 
This Article presents how to speed up Power Amplifier Design by fast source-pull, real-time load-pull and accurate measurement-based behavioural models.

Article 2005-11-01

PDF PDF 1.71 MB
RF/Microwave Oscillator Phase Noise calculation - Envelope Transient Technique 
A brief Technical Overview on Rigorous RF and Microwave Oscillator Phase Noise calculation using Envelope Transient Technique by E. Ngoya, J. Rousset, and D. Argollo

Technical Overview 2005-06-22

PDF PDF 322 KB
Calibrating Standards for In-Fixture Device Characterization 

Application Note 2005-06-17

PDF PDF 237 KB
8 Hints for Making and Interpreting EVM Measurements Application Note 
This document provides tips on error vector magnitude (EVM) measurements. EVM provides insight into the performance of digital communications transmitters and receivers. EVM can pinpoint signal degradations.

Application Note 2005-05-20

PDF PDF 391 KB
ESA-E Series Spectrum Analyzer Performance Guide Using 89600 VSA Software 
This application note characterizes the performance of the ESA-E series spectrum analyzers and the 89600 vector signal analysis software.

Application Note 2005-05-09

Investigating Microvia Technology for 10 Gbps Higher Telecommunications Systems 

Application Note 2005-04-05

PDF PDF 1.37 MB
Wideband RF & Baseband Transmitter Modulation Analysis - Application Note 
This application note shows how the combination of the PSA spectrum analyzer, an oscilloscope, and the 89600 VSA software provides versatile wideband measurements.

Application Note 2004-12-10

PDF PDF 1.43 MB
Correlation of Simulation vs. Measurement in Frequency and Time Domain 
For multi-gigahertz serial data link.

Application Note 2004-12-10

PDF PDF 1.24 MB
Performance Spectrum Analyzer Series: Swept and FFT Analysis Application Note 
This Product Note covers the measurement speed and other benefits of advanced signal processing in the new PSA Performance Spectrum Analyzer Series.

Application Note 2004-10-19

81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) - Application Note 
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

Application Note 2004-10-18

PDF PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note 
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

PDF PDF
89441A Vector Signal Analyzer Phase Noise Measurements 
The procedure takes you step-by-step through a phase noise measurement on the 89441A using two methods: direct spectrum and PM demodulation. No options are required to make this measurement.

Application Note 2004-07-26

PDF PDF 90 KB
Linearizing PAs using Digital Predistortion, EDA Tools and Test Hardware 
This Article describes the process for developing and implementing an effective power amplifier linearization scheme using baseband adaptive digital pre-distortion.

Article 2004-04-01

PDF PDF 490 KB
PSA Performance Spectrum Analyzer Series: Measurement Innovations and Benefits 
Performance Spectrum Analyzer Series. This Note is a general overview of all of the major new technologies used in the PSA series, with a focus on the measurement benefits they provide...

Application Note 2004-02-27

Diagnosing and Solving Resonance Problems 
One of the most common reasons for high vibration of plant equipment is some form of resonance of the equipment components or support structure. Every mechanical system has resonant frequencies (damped natural frequencies). If the system is exposed to vibration at these frequencies, it will...

Application Note 2004-02-20

PDF PDF 38 KB
PNA - Pulsed Measurement Accuracy (1408-11) 

Application Note 2004-02-17

Noise Figure Measurements of Frequency Converting Devices, AN 1487 
"This application note provides details and examples about how the Keysight NFA Series noise figure analyzer (NFA) performs measurements in amplifier, downconverter and upconverter measurement mode".

Application Note 2004-02-06

Non-Zero Noise Figure After Calibration (AN 1484) 
This Application Note attempts to explain the reasons behind the zero-error and shows with examples that it does not have a compromising effect on instrument accuracy in a measurement situation.

Application Note 2004-01-20

PDF PDF 95 KB
Optimized Impedance Standard Substrate Designs for Dual and Differential Applications 
by Cascade Microtech

Application Note 2003-12-09

PDF PDF 238 KB

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