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RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Power Amplifier Design Speed-Up Techniques 
This Article presents how to speed up Power Amplifier Design by fast source-pull, real-time load-pull and accurate measurement-based behavioural models.

Article 2005-11-01

PDF PDF 1.71 MB
RF/Microwave Oscillator Phase Noise calculation - Envelope Transient Technique 
A brief Technical Overview on Rigorous RF and Microwave Oscillator Phase Noise calculation using Envelope Transient Technique by E. Ngoya, J. Rousset, and D. Argollo

Technical Overview 2005-06-22

PDF PDF 322 KB
Calibrating Standards for In-Fixture Device Characterization 

Application Note 2005-06-17

PDF PDF 237 KB
8 Hints for Making and Interpreting EVM Measurements Application Note 
This document provides tips on error vector magnitude (EVM) measurements. EVM provides insight into the performance of digital communications transmitters and receivers. EVM can pinpoint signal degradations.

Application Note 2005-05-20

PDF PDF 391 KB
ESA-E Series Spectrum Analyzer Performance Guide Using 89600 VSA Software 
This application note characterizes the performance of the ESA-E series spectrum analyzers and the 89600 vector signal analysis software.

Application Note 2005-05-09

Investigating Microvia Technology for 10 Gbps Higher Telecommunications Systems 

Application Note 2005-04-05

PDF PDF 1.37 MB
Wideband RF & Baseband Transmitter Modulation Analysis - Application Note 
This application note shows how the combination of the PSA spectrum analyzer, an oscilloscope, and the 89600 VSA software provides versatile wideband measurements.

Application Note 2004-12-10

PDF PDF 1.43 MB
Correlation of Simulation vs. Measurement in Frequency and Time Domain 
For multi-gigahertz serial data link.

Application Note 2004-12-10

PDF PDF 1.24 MB
Performance Spectrum Analyzer Series: Swept and FFT Analysis Application Note 
This Product Note covers the measurement speed and other benefits of advanced signal processing in the new PSA Performance Spectrum Analyzer Series.

Application Note 2004-10-19

81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) - Application Note 
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

Application Note 2004-10-18

PDF PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note 
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

PDF PDF
Linearizing PAs using Digital Predistortion, EDA Tools and Test Hardware 
This Article describes the process for developing and implementing an effective power amplifier linearization scheme using baseband adaptive digital pre-distortion.

Article 2004-04-01

PDF PDF 490 KB
PSA Performance Spectrum Analyzer Series: Measurement Innovations and Benefits 
Performance Spectrum Analyzer Series. This Note is a general overview of all of the major new technologies used in the PSA series, with a focus on the measurement benefits they provide...

Application Note 2004-02-27

PNA - Pulsed Measurement Accuracy (1408-11) 

Application Note 2004-02-17

Noise Figure Measurements of Frequency Converting Devices, AN 1487 
"This application note provides details and examples about how the Keysight NFA Series noise figure analyzer (NFA) performs measurements in amplifier, downconverter and upconverter measurement mode".

Application Note 2004-02-06

Non-Zero Noise Figure After Calibration (AN 1484) 
This Application Note attempts to explain the reasons behind the zero-error and shows with examples that it does not have a compromising effect on instrument accuracy in a measurement situation.

Application Note 2004-01-20

PDF PDF 95 KB
In-Fixture Characterization Using the ENA Series RF Network Analyzer with Cascade Microtech... 
This product note explains a new approach for in-fixture characterization, using the Keysight ENA Series RF network analyzer with Cascade Microtech's probing system.

Application Note 2003-10-13

Creating Measurement-Based Amplifier Behavioral Models 
This Application Note describes a behavioral model used in circuit and system simulations to verify performance of the amplifier within a circuit or system.

Application Note 2003-10-01

Network Analysis Solutions Advanced Filter Tuning Using Time Domain Transforms (AN 1287-10) 
Tuning multi-stage, coupled-resonator band-pass filters is difficult due to interactions between resonator and coupling tuning. To achieve the proper pass-band response and to get low return loss you must precisely tune the frequency of each resonator and precisely set each coupling between the...

Application Note 2003-05-25

Obtain Flat-Port Power with Keysight's PSG User Flatness Correction or External Leveling Functions 
The PSG series is ideally suited for design and test systems with high frequencies, wide bandwidths and complex modulation formats. This Product Note explains how to obtain flat...

Application Note 2003-02-04

EPM-P Series Power Meters Used in Radar and Pulse Applications (AN 1438) 

Application Note 2003-01-28

Designing and Testing cdma2000 Mobile Stations - Application Note 1358 
One of the proposals for the IMT-2000 requirements for a 3G global wireless communications system is cdma2000. This application note describes mobile station design and measurement issues at the physical layer (layer 1) that may be different between cdma2000 and cdmaOne.

Application Note 2003-01-13

Automated Circuit Modeling Tool for Arbitrary Passive Microwave and RF Components 
This Paper describes an automated circuit-modeling tool developed for arbitrary passive components. The tool builds compact, parameterized, analytical models based on fullwave EM simulations.

Technical Overview 2002-06-24

PDF PDF 105 KB
Overview on Constrained EM-based Modeling of Passive Components 
An Overview by Tom Dhaene, Jan De Geest and Daniel De Zutter (Keysight Technologies) focusing on details of constrained EM-based modeling of passive components.

Technical Overview 2002-06-01

PDF PDF 378 KB
How to Build EM-Accurate Parameterized Passive Models? 
An Article by Mounir Adada (Keysight Technology) highlights how modern EM parametric modeling tools can contribute in getting the products out the door right the first time.

Article 2002-05-30

PDF PDF 165 KB

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