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81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) - Application Note 
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

應用手冊 2004-10-18

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81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note 
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

應用手冊 2004-10-12

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