Here’s the page we think you wanted. See search results instead:

 

Sprechen Sie mit einem Experten

RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

1-6 of 6

Sort:
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2019-04-09

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2016-07-14

 
New LDMOS Model Delivers Powerful Transistor Library - Part 1 
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

Article 2014-07-31

PDF PDF 544 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 2 
This article reprint presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

Article 2014-07-31

PDF PDF 699 KB
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design 
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

Article 2014-07-31

PDF PDF 592 KB
Overview: Applying Nonlinear RF Device Modeling to Verify S-Parameter Linearity 
This Article is intended to explain the basics of “what’s behind S-parameters” from a modeling engineer's standpoint & on how to apply Harmonic Balance simulators to check the validity of device models.

Article 2001-09-01

PDF PDF 460 KB