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RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

Technical Overview 2017-12-01

PDF PDF 1.75 MB
Wideband Digital Pre-Distortion with Keysight SystemVue & PXI Modular Instrument - Application Note 
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Load Pull + NVNA = Enhanced X-Parameters for PA Designs  
With high mismatch and technology-independent large-signal device models.

Application Note 2011-09-08

 
Fast Circuit Envelope Models for RFIC verification 
Fast Circuit Envelope Models for RFIC verification Learn to verify 4G/LTE wireless RFIC transceivers 1000x faster using the GoldenGate “Fast Circuit Envelope” models in SystemVue.

Demo 2011-04-18

 
X-parameters Aid MMIC Design 
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Article 2010-07-15

 
X-parameters News 
Press Releases related to Agilent's X-parameters

Press Materials 2009-08-21

 
Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation 
Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation for Components Used in Wireless, Aerospace Defense Industries

Press Materials 2008-12-17

 
Data Mining 12-Port S-Parameters 

Application Note 2008-08-11

PDF PDF 830 KB