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RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Nonlinear Vector Network Analyzer (NVNA) Brochure 
NVNA provides the critical leap in technology to go beyond linear S-parameters, allowing efficient and accurate analysis and design of active devices under real world operating conditions.

Brochure 2018-05-31

PDF PDF 6.26 MB
Agilent Technologies Engineers Author X-Parameters* Book 
Agilent Technologies Engineers Author X-Parameters* Book

Press Materials 2013-10-30

 
X-parameters: Commercial implementations of the latest technology enable mainstream applications 
This blog article from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters.

Article 2011-01-06

 
X-parameters Aid MMIC Design 
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Article 2010-07-15

 
A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals 
Model memory effects of microwave amplifiers in the case of wideband modulated signals.

Application Note 2010-05-05

PDF PDF 616 Bytes
Fundamentally Changing Nonlinear Microwave Design 
Provides an overview of the invention and need for X-parameters to model the behavior of non-linear devices. This is an article was originally from Microwave Journal, Issue March 2010, Vol.53. No.3

Feature Story 2010-03-09

 
Video Demos on Generating X-Parameters from Circuit Level Designs 
This four part series of demonstration videos shows how to generate X-parameters from circuits.

Demo 2009-09-28

 
X-parameters News 
Press Releases related to Agilent's X-parameters

Press Materials 2009-08-21

 
Solutions for Characterizing and Designing Linear Active Devices 
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.

Application Note 2009-08-21

Extension of X-parameters to Include Long-Term Dynamic Memory Effects 
IEEE MTT-S International Microwave Symposium Digest, Boston

Application Note 2009-06-05

 
Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test 

Press Materials 2009-06-01

 
Electronic Products - 2008 Product of the Year Award 
Analyzer changes fundamental way communications networks are designed

Article 2009-01-01

 
Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation 
Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation for Components Used in Wireless, Aerospace Defense Industries

Press Materials 2008-12-17

 
Polyharmonic Distortion Modeling - Article Reprint 

Application Note 2006-06-01

PDF PDF 2.67 MB