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임피던스 측정 핸드북  

어플리케이션 노트 2012-07-06

Multifrequency C-V Measurements of Semiconductors (AN 369-5) 
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

어플리케이션 노트 2008-12-10

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Keysight 4294A(PN4294-3) 
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

어플리케이션 노트 2003-06-26