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RF + Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2018-03-05

How to Avoid Costly Mistakes in Designing Phased Array Systems 
This video will show how to avoid 3 costly steps in designing a phased array. 1) Not predicting the failure of spurious emission masks (SEM) in simulation, which leads to higher development cost and missing time to market windows. 2) Not exploring thoroughly in one simulation, which leads to blind angles. 3) Relying primarily on spreadsheet calculations, which leads to longer design and development cycles.

How-To Video 2018-02-01

Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-12-13

Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-12-01

New Pulse Analysis Techniques for Radar and EW - Application Note 
This app note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

Application Note 2017-12-01

Simulation and Verification of Pulse Doppler Radar Systems - Application Note 
Keysight SystemVue illustrates key algorithms in modern Pulsed Doppler radar system design, and also connects to Keysight sources and signal analyzers to verify hardware performance.

Application Note 2017-12-01

PDF PDF 10.43 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2017-12-01

M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

Technical Overview 2017-12-01

5G Waveform Evaluations For mmWave Communication Using SystemVue 
This application note evaluates and compares the performance of various state-of-the art waveforms in the presence of hardware impairments.

Application Note 2017-11-04

ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

Demo 2017-10-31

10 Hints for Making Successful Noise Figure Measurements (AN 57-3) - Application Note 
This document will help minimize the uncertainties in your noise figure measurements. Key topics include minimizing extraneous signals, mismatch uncertainties, nonlinearities, and path losses.

Application Note 2017-10-20

N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

Data Sheet 2017-10-04

New 89600 VSA Software Release Helps Component, Module, System Designers Achieve 5G First-to-Market  
Software lets designers jumpstart development with 5G analysis capabilities for signal-quality measurements of Verizon 5G signals today, planned support for 5G new radio standard signals.

Press Materials 2017-09-29

Keysight to Showcase Latest Measurement, Test, Design Innovations at European Microwave Week 2017 
Keysight announces it will showcase a wide range of design, test and characterization solutions at European Microwave Week 2017, Booth 107, Nuremberg Convention Center Nuremberg, Oct. 10–12.

Press Materials 2017-09-19

5G: How Do You Test for a Standard that Doesn’t Even Exist? 
5G NR is ascending rapidly as the 5G technology of choice, but it turns out lots can be done to get ready as it goes through the formal 3GPP channels.

Article 2017-09-19

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2017-09-06

Accessories Catalog for Impedance Measurements - Catalog 
This catalog introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers. ADDITIONAL MODELS: 16196A 16196B 16196C 16197A 16064B 16190B 16380A 16380C 42030A 42090A 42091A

Selection Guide 2017-08-24

Environment Aware Virtual Vehicle-To-Vehicle System Design  
ECN article by Wilfredo Rivas-Torres, PhD, Sr. EDA Application Engineer and Wenyan Ding, Sr. EDA EM Application Engineer at Keysight Technologies.

Article 2017-08-08

How to Estimate Voltage Spikes from Layout Parasitic Inductance in Switched-Mode Power Supplies 
We showed you how to deal with layout parasitic inductance in our previous video entitled “How to design DC-to-DC power converters”, but a frequently asked question was “When should I start to worry about layout parasitics inductance? Is there a quick rule of thumb that says kind of ‘Caution: Further investigation’s needed?’” The answer is yes and this follow up video is about how to make these estimates.

How-To Video 2017-07-17

SystemVue 2017 Simulation Platform Effectively Lowers ASTRI’s NB-IoT XCVR Cost, Power Requirements 
Keysight announces that its premier simulation platform for system design and verification, SystemVue 2017, significantly contributed to an improvement to the narrowband internet of things (NB-IoT) standard. SystemVue enables users to combine existing baseband, RF, and channel models together for evaluation of the entire system. The improvement realized using SystemVue, optimizes the NB-IoT user equipment (UE) standard to facilitate the implementation of low-power NB-IoT terminal chips and will be incorporated in Release 13 (revised version) and 14 of the 3GPP standard.

Press Materials 2017-07-13

Making Better Models with User Data 
This paper details the process of combining MATLAB and the RF System analysis to improve the accuracy of simulations via personalized models.

Application Note 2017-06-24

EDAcafé - DAC 2017 Interview: Michel Azarian, Silicon RFIC EDA Program Manager 
Sanjay Gangal from EDAcafé interviews Michel Azarian (Keysight Technologies' Silicon RFIC EDA Program Manager) at Design Automation Conference (DAC) 2017.

Demo 2017-06-22

IMS 2017: What's new with Keysight's SystemVue 2017 
Keysight's How-Siang Yap demonstrates the new features of SystemVue 2017 for Microwave Journal at IMS 2017 in Hawaii.

Demo 2017-06-21

Keysight EEsof EDA SystemVue 
SystemVue is an EDA environment for electronic system-level (ESL) design that allows system architects and algorithm developers to innovate the physical layer (PHY) of communications systems.

Technical Overview 2017-06-21

SystemVue Electronic System-Level (ESL) Design Software 
SystemVue ESL design software is a multi-domain modeling implementation and verification cockpit for electronic system-level (ESL) design.

Brochure 2017-06-20


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